A Quarterly Publication of The Microelectronics Packaging & Test Engineering Council
Volume 25, Number 4
CLOSING OUT 2021 page 3
2021 +
Harnessing the Power of Data in Semiconductor Test page 11
INSIDE THIS ISSUE
3
UP FRONT It was certainly a year of mixed emotions, especially with progress towards the “new normal”.
4
CALL TO ACTION FPGA device makers missed a strategic window of opportunity to qualify alternative suppliers of solder columns.
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16
COUPLING & CROSSTALK Fear of failure or not finding the best solution often results in “analysis paralysis” which prevents action.
CATCHING UP WITH Ravi Mahajan, Assembly and Test Technology Pathfinding at Intel joined the MEPTEC Advisory Board in 2020.
WINTER 2021
MEPTECReport