with trace concentrations below 0.01 m% can be detected. Moreover, SXES is very suitable for studying chemical environment of atoms rather than just their elemental identification. FEG-EPMA is being widely used for our customer’s needs such as studying surface defects, coatings (organic and inorganic), corrosion studies, inclusions and segregation, elemental distribution (mapping) in general. The analysis of metallic coatings is a good example of the added value of our FEGEPMA. The development of these coatings deals with altering their microstructure. The picture utmost left clearly indicates only a new EPMA can tackle this issue.
Composite mapping where intensity is related to Fe oxidation state
A second added value of EPMA is the use of wavelength dispersive X-ray spectroscopy (WDX) detectors with enhanced spectral resolution compared to traditional (energy dispersive) EDX. The mapping left shows the distribution of various iron oxide species, rather than just the element Fe. This tells us exactly where the different oxides are formed in the scale layer, and helps to understand the formation of good adherent scales.
Spectacular calibration line for nitrogen in steel
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