Application of Piezoelectric Objective Scanner in Microscope
Application of Piezoelectric Objective Scanner in Microscope New super-resolution technologies, such as stimulated emission depletion microscopy, light-activated positioning microscopy and random optical reconstruction microscopy, have reduced the resolution from 100–200nm to even lower. The piezoelectric objective scanner with nanometer resolution is very suitable for these applications. The alignment of the microscope and the sample holder requires precise and fast movement. The piezoelectric objectivescanner driven by high-resolution piezoelectric ceramics can provide unique ultra-precision technical support.
P72 series piezoelectric objective scanner is specially designed for microscope applications. It is designed with a non-backlash flexible hinge parallel guide mechanism. It is frictionless and has extremely high resolution, small compensation, and ultra-high focus stability, which is very suitable sample adjustment, beam alignment and beam tracking applications.
Features Z axis motion 100μm travel range 2.5nm resolution Unload resonant frequency 350Hz Unload step time 3ms P72 piezoelectric objective scanner is small in size and compact in structure, and can realize stroke to 100μm. It is connected to the top of the lens through threaded adapter, and the thread can be selected arbitrarily, which can be adapted to a variety of standard lenses such as Olympus, Zeiss, Nikon, Leica, etc., and can be customized. The no-load resonance frequency can reach 350Hz, and it can carry 200g load for high-speed and precise movement, and is widely used in optical scanning, confocal microscopy and other fields.