CoreMorrow 900g Large Load Piezo Objective Scanner

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CoreMorrow900gLargeLoadPiezoObjectiveScanner

WhatisaPiezoOjectiveScanner?

PiezoobjectivescannerisspeciallydesignedforobjectivefocusingmicroscopyConfiguredwith non-regressiveflexiblehingeparallelsteeringmechanism,ithassmallcompensationquantity andhighfocusingstabilityPiezoobjectivescannerwithmicroscopicinspection/measurementor observationdevice,candrivetheobjectivelenstofocusandadjustZ-axismotion.Itcanbeused withavarietyofhighresolutionmicroscopestoimprovethefocusingaccuracyoftheobjectiveto nanometer.

ApplicationofHigh-loadPiezoObjectiveScanner

Thelarge-loadpiezoobjectivescannerhasalargeloadcapacity,upto900gorevenhigher,which canbeusedforheavyloadpiezoobjectivescanner.

1.LaserWaferInvisibleCutting

Laserwaferinvisiblecutting,istofocusthelasersthroughlens,andthenthepositionofthefocus ispreciselyadjustedbythepiezoobjectivescanner,sothatthefocusispreciselypositionedat thepartofthewafertobecut.Thetemperatureoftheparttobecutrisesrapidly,andthenitis meltedorvaporizedWiththelaserandtherelativemovementofthecuttingmaterial,aplurality ofpointsisformedonthecuttingmaterial.

CoreMorrow900gLargeLoadPiezoObjectiveScanner

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2.ImprovingtheFocusingAccuracyofOrdinaryMicroscopes

Thefine-tuningdistanceofthepiezoobjectivescannercanbecontrolledbythepiezocontroller Thevariableoutputvoltageofthepiezocontrollercorrespondstothezero-to-fullstroke displacementofthepiezoobjectivescanner,andthetwohavealinearrelationshipThe fine-tuningdistanceofthepiezoobjectivescannercanbecontrolledbychangingthevariable outputvoltageofthepiezocontrollerComparedtoordinarymicroscopehandwheeladjustment, thefocusingaccuracyishigheruptothenanometerlevel.

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CoreMorrow900gLargeLoadPiezoObjectiveScanner

CoreMorrow900gLargeLoadPiezoObjectiveScanner

3.AppliedtoSuper-resolutionMicroscopicImaging

Microscopicopticalimagingreferstothetechnologyofmagnifyingimagesoftinysamplesfrom thevisiblelightreflectedthroughorfromsamplesSuperresolution(SR)microscopyisabroad concepttodescribetheemergingopticalmicroscopeAlthoughconventionalopticalmicroscopes canachieve100nanometersresolution,thisultra-resolutiontechnologycanachievehigher resolutionevenuptotensofnanometers.TheSRmicroscopeusesspecificfluorescentprobe propertiestoseparatethephotonsemittedbytwocloselyspacedfluorescentsourcessothat theycanbeimagedseparately,avoidingdiffractionlimitsandallowingthedynamiceffectsof cellsinthenanoworldtobeobserved

Newsuper-resolutiontechniques,suchasstimulatedemissionlossmicroscopy,light-activated localizationmicroscopyandrandomopticalreconstructionmicroscopy,havereducedresolution from100-200nmtoevenlowerPiezoobjectivescannerswithnanometerresolutionisidealfor theseapplicationsThealignmentofthemicroscopeandthesamplestandrequiresaccurateand rapidmovementPiezoobjectivescannerbasedonhighresolutionpiezoceramicscanprovide uniqueultra-precisiontechnologysupport.

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4.LaserLithography,OpticalDiskDataStorage

Thephotolithographyprocessmeansthatthephotolithographysubstrateplacedontheelectric platformrotatesandmovesalongwiththeelectricplatform,andtheacoustoopticmodulator controlsthestrengthoflightbeamtoexposethephotolithographyatvaryingdosesUsually,the positioningaccuracyoftheelectricplatformreachesmicronorsubmicronmagnitude.However, thepitcherroranddeviationoftheelectricplatformcausedbyinertia,staticfrictionand looseningwilldirectlyaffecttheperformanceofthesystemandthequalityofthelithographic elementsWiththenanoscaleaccuracy,stableperformanceandconvenientoperation, Coremorrowpiezoobjectivescannerwouldbeanidealchoiceforscanningmotionplatformin lithographyequipment

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5.WhiteLightInterferenceand3DEndFaceDetection

Whitelightinterferencetechnologytakesvisiblelightasthelightsource.Thewhitelightemitted bythelightsourcereflectshalfofthelightintensityinthesemi-transmittedopticalplaneafter passingthroughtheinterferenceobjectivelens,andtheotherhalfofthelightintensityis transmittedandirradiatedonthesurfaceofthemeasuredobjectandreflectedagainintothe interferenceobjectivelens,whichinterfereswiththereflectedlightintheoriginalopticalplane WithCoremorrowpiezoobjectivescanner,theaccuracycanachievenanometerresolution

Atpresent,opticalinterferenceiscommonlyusedtomeasuretheopticalfiberendfaceOptical interferenceisbasedonthecoherentlightencounterinspace,whichenhanceorweakenin differentareas,formingastablestrongandweakdistributionThe3Dinterferometersystemis designedonthisprinciple.interferencefringescanbeobservedbyCCDcamera,Coremorrow piezoobjectivescannerisusedtomovetheinterferenceobjectivelenstoproducephase movement,theimagemeasuredbyCCDcameraistransmittedtothecomputerbyimagecardfor analyticalprocessingInterferencefringesarereadbyCCDcameraaftereachstep,andtheend faceshapeiscalculatedaccordingtothedistributionofinterferencefringes

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CoreMorrow900gLargeLoadPiezoObjectiveScanner

CoreMorrowLargeLoadPiezoObjectiveScanner

CoreMorrow900gLargeLoadPiezoObjectiveScanner
CoreMorrow900gLargeLoadPiezoObjectiveScanner
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Formoredetails,pleasecontactCoreMorrowbycalling0451-86268790,17051647888(Wechat

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