CoreMorrow900gLargeLoadPiezoObjectiveScanner
WhatisaPiezoOjectiveScanner?
PiezoobjectivescannerisspeciallydesignedforobjectivefocusingmicroscopyConfiguredwith non-regressiveflexiblehingeparallelsteeringmechanism,ithassmallcompensationquantity andhighfocusingstabilityPiezoobjectivescannerwithmicroscopicinspection/measurementor observationdevice,candrivetheobjectivelenstofocusandadjustZ-axismotion.Itcanbeused withavarietyofhighresolutionmicroscopestoimprovethefocusingaccuracyoftheobjectiveto nanometer.
ApplicationofHigh-loadPiezoObjectiveScanner
Thelarge-loadpiezoobjectivescannerhasalargeloadcapacity,upto900gorevenhigher,which canbeusedforheavyloadpiezoobjectivescanner.
1.LaserWaferInvisibleCutting
Laserwaferinvisiblecutting,istofocusthelasersthroughlens,andthenthepositionofthefocus ispreciselyadjustedbythepiezoobjectivescanner,sothatthefocusispreciselypositionedat thepartofthewafertobecut.Thetemperatureoftheparttobecutrisesrapidly,andthenitis meltedorvaporizedWiththelaserandtherelativemovementofthecuttingmaterial,aplurality ofpointsisformedonthecuttingmaterial.
CoreMorrow900gLargeLoadPiezoObjectiveScanner
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2.ImprovingtheFocusingAccuracyofOrdinaryMicroscopes
Thefine-tuningdistanceofthepiezoobjectivescannercanbecontrolledbythepiezocontroller Thevariableoutputvoltageofthepiezocontrollercorrespondstothezero-to-fullstroke displacementofthepiezoobjectivescanner,andthetwohavealinearrelationshipThe fine-tuningdistanceofthepiezoobjectivescannercanbecontrolledbychangingthevariable outputvoltageofthepiezocontrollerComparedtoordinarymicroscopehandwheeladjustment, thefocusingaccuracyishigheruptothenanometerlevel.
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CoreMorrow900gLargeLoadPiezoObjectiveScanner
CoreMorrow900gLargeLoadPiezoObjectiveScanner
3.AppliedtoSuper-resolutionMicroscopicImaging
Microscopicopticalimagingreferstothetechnologyofmagnifyingimagesoftinysamplesfrom thevisiblelightreflectedthroughorfromsamplesSuperresolution(SR)microscopyisabroad concepttodescribetheemergingopticalmicroscopeAlthoughconventionalopticalmicroscopes canachieve100nanometersresolution,thisultra-resolutiontechnologycanachievehigher resolutionevenuptotensofnanometers.TheSRmicroscopeusesspecificfluorescentprobe propertiestoseparatethephotonsemittedbytwocloselyspacedfluorescentsourcessothat theycanbeimagedseparately,avoidingdiffractionlimitsandallowingthedynamiceffectsof cellsinthenanoworldtobeobserved
Newsuper-resolutiontechniques,suchasstimulatedemissionlossmicroscopy,light-activated localizationmicroscopyandrandomopticalreconstructionmicroscopy,havereducedresolution from100-200nmtoevenlowerPiezoobjectivescannerswithnanometerresolutionisidealfor theseapplicationsThealignmentofthemicroscopeandthesamplestandrequiresaccurateand rapidmovementPiezoobjectivescannerbasedonhighresolutionpiezoceramicscanprovide uniqueultra-precisiontechnologysupport.
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4.LaserLithography,OpticalDiskDataStorage
Thephotolithographyprocessmeansthatthephotolithographysubstrateplacedontheelectric platformrotatesandmovesalongwiththeelectricplatform,andtheacoustoopticmodulator controlsthestrengthoflightbeamtoexposethephotolithographyatvaryingdosesUsually,the positioningaccuracyoftheelectricplatformreachesmicronorsubmicronmagnitude.However, thepitcherroranddeviationoftheelectricplatformcausedbyinertia,staticfrictionand looseningwilldirectlyaffecttheperformanceofthesystemandthequalityofthelithographic elementsWiththenanoscaleaccuracy,stableperformanceandconvenientoperation, Coremorrowpiezoobjectivescannerwouldbeanidealchoiceforscanningmotionplatformin lithographyequipment
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5.WhiteLightInterferenceand3DEndFaceDetection
Whitelightinterferencetechnologytakesvisiblelightasthelightsource.Thewhitelightemitted bythelightsourcereflectshalfofthelightintensityinthesemi-transmittedopticalplaneafter passingthroughtheinterferenceobjectivelens,andtheotherhalfofthelightintensityis transmittedandirradiatedonthesurfaceofthemeasuredobjectandreflectedagainintothe interferenceobjectivelens,whichinterfereswiththereflectedlightintheoriginalopticalplane WithCoremorrowpiezoobjectivescanner,theaccuracycanachievenanometerresolution
Atpresent,opticalinterferenceiscommonlyusedtomeasuretheopticalfiberendfaceOptical interferenceisbasedonthecoherentlightencounterinspace,whichenhanceorweakenin differentareas,formingastablestrongandweakdistributionThe3Dinterferometersystemis designedonthisprinciple.interferencefringescanbeobservedbyCCDcamera,Coremorrow piezoobjectivescannerisusedtomovetheinterferenceobjectivelenstoproducephase movement,theimagemeasuredbyCCDcameraistransmittedtothecomputerbyimagecardfor analyticalprocessingInterferencefringesarereadbyCCDcameraaftereachstep,andtheend faceshapeiscalculatedaccordingtothedistributionofinterferencefringes
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CoreMorrow900gLargeLoadPiezoObjectiveScanner
CoreMorrowLargeLoadPiezoObjectiveScanner
CoreMorrow900gLargeLoadPiezoObjectiveScanner
CoreMorrow900gLargeLoadPiezoObjectiveScanner
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