IRJET- Reduction of Power, Leakage and Area of a Standard Cell Asics using Threshold Logic Flip Flop

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International Research Journal of Engineering and Technology (IRJET)

e-ISSN: 2395-0056

Volume: 06 Issue: 05 | May 2019

p-ISSN: 2395-0072

www.irjet.net

Reduction of Power, Leakage and Area of a Standard Cell ASICs using Threshold Logic Flip Flops and Power Gating Techniques Karthika Aravind1, Nidiya Habeeb2, Saju A3 1PG

Scholar, Dept. Of ECE, MCET, Pathanamthitta, Kerala Professor, Dept. of ECE, MCET, Pathanamthitta, Kerala 3Research Scholar, VTU, Karnataka ----------------------------------------------------------------------------------***---------------------------------------------------------------------------------2Associate

Abstract - In this paper, a new approach to reduce dynamic power, leakage, and area of standard cell ASICs, without sacrificing its performance is described. The approach is based on designing a threshold logic gates (TLGs) and its integration with the conventional standard-cell design flow. The threshold gate behaves as a multi-input, single- output, edge triggered flip-flop, which computes a threshold function of the inputs on the clock edge. The function realized by a given threshold gate is determined by how signals are mapped to its inputs. Here pulsed inputs of varying width are provided at the input. The resulting circuits, with both conventional and TLGs (called hybrid circuits), are placed and routed using commercial tools. Here the tool used is Tanner tool v13. The power gating techniques is used along with threshold logic gates to reduce the leakage and dynamic power dissipation. This power gating method along with TLF improves the area and power of the ASIC circuits. The proposed circuit is designed in 45nm technology. A significant reduction in power, leakage, and area of the hybrid circuits when compared with the conventional logic circuits is observed. Key Words: MTCMOS, Threshold logic Flip flop (TLF), Power Gating Techniques.

1. INTRODUCTION The demand and popularity of portable electronics is driving designers to strive for smaller silicon area, higher speed, longer battery life and more reliability. Power is one of the premium resource a designer tries to save when designing a system. In every circuit, power dissipation occurs. It is not possible to eliminate it completely but the amount of dissipation can be reduced. Conventional ASIC design involves constructing network of CMOS logic gates to implement a given function. Low power Application specific integrated circuit (ASIC) design results in increased battery life and reliability enhancement. In this paper, a threshold logic gate methodology is used along with some power reduction techniques to improve the ASIC performance. This methodology is based on the design of threshold logic gates and its integration with conventional standard cell design. Threshold gate is a multiple input, single output, edge triggered flip flop. This flip flop computes the threshold function of the inputs on the clock edge. The resulting circuit is a hybrid circuit which is the combination of conventional logic gates and threshold logic cells. By using this hybrid circuit, the power dissipation can be reduced compared to conventional designs. First we have analysed the architecture and operation of basic PNAND cell. After that a new approach for computing threshold is implemented. Finally this new approach is combined with power gating techniques to reduce the dynamic and leakage power dissipation in the circuit. So the final design will have the combination of conventional standard cells (AND, OR, NAND, NOR) and PNAND cell.

2. THRESHOLD LOGIC FLIP FLOP The fig-1 shows the basic schematic of threshold gate with k- inputs, referred to as PNAND-k cell. The circuit consists of three parts, namely, input network, sense amplifier and SR latch. The input network is divided into two networks namely Left input network (LIN) and Right input network (RIN). Both these networks are complement to each other.

Š 2019, IRJET

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