GRD Journals | Global Research and Development Journal for Engineering | International Conference on Innovations in Engineering and Technology (ICIET) - 2016 | July 2016
e-ISSN: 2455-5703
Reducing the Test Data Volume by Enhanced Compression Code 1Devi
Sowndarya K.K. 2Kalamani.C 3Dr.K.Paramasivan 1,2,3 Department of Electronics and Communication Engineering 1,2 Dr.Mahalingam College of Engineering and Technology, Pollachi-642002 3Karpagam College of Engineering, Coimbatore-641032 Abstract Because of the increased design complexity and advanced fabrication technologies, number of tests and corresponding test data volume increases rapidly. As the large size of test data volume is becoming one of the major problems in testing System on- aChip (SOC). Test data volume reduction is an important issue for the SOC designs. Several compression coding schemes had been proposed in the past. Run Length Coding was one of the most familiar coding methodologies for test data compression. Golomb coding was used in existing compression side. The compression ratio of golomb code was found to be lesser than the combined Alternative Variable Run-length code (AVR) and nine code compression (9C) methods. The proposed combined AVR and 9C codes are used for reducing the test data volume. The experiment is conducted for proposed methods using ISCAS’89 benchmark circuits. The experimental results shows that, the proposed method is highly efficient when compared with the existing methods. Keyword- SOC, Integrated coding, FSM, Test Data Compression, efficiency __________________________________________________________________________________________________
I. INTRODUCTION The complexity of VLSI continues to grow; more number of transistors is integrated on a single chip and test data volume has drastically increased. The testing cost and testing power are two major issues in the current generation integrated chip testing. Testing cost is related to test data volume. The cost includes a number of parameters, but the major one is the cost of Automatic Test Equipment proposed by Pranab.K. Nag et al. Such it is difficult to transmit huge test data from ATE to system-on-a-chip (SOC). The commercial ATE’s have limited memory, bandwidths and I/O channel capacity. Testing cannot precede any faster than the amount of time required to transfer the data: Test time >= (amount of test data on tester)/ (number of tester channels)*(tester clock rate) As we can see from the above equation that the test time is directly proportional to the test data hence we can reduce this test data to reduce testing time proposed by Pranab.K. Nag et al. The testing time of SOC directly impacts the test cost. It is determined by several factors, including the test data volume, the test required to transfer test data to the cores and the maximum scan chain length. While test data volume reduction techniques can be applied to soft and hard cores, scan chains cannot modified in hard (IP) cores. New techniques are therefore needed to reduce the test data volume, decrease testing time, and overcome ATE memory limitations for SOCs containing IP cores. Build-in self-test (BIST) proposed by S.Lei et al has emerged as an alternative to ATE-based external testing. It allows precomputed test sets to be embedded in the test sequences generated by on-chip hardware, supports test reuse and at speed testing. Test data compression offers a promising solution to the problem of reducing the test data volume, special when the cores are not BIST ready. The test volume reduction consists of compressing the original test data, storing the compressed data in ATE, and then decompressing them for restoring the original test volume. Three basic methods for reducing test data compression: proposed by N.A.Tauba and Abramovici.M et al Code-based schemes, Linear-decompression-based schemes and Broadcast-scan-based schemes. An alternative approach for reducing test data volume for SOCs is based on the use of data compression techniques such as: proposed by N.A.Tauba Run length based, Dictionary based, Statistical codes and Constructive codes. In this paper we will concentrate on run length based codes. The proposed work has been compared with Golomb code was proposed by Priyanka Kalode et al, AVR was proposed by B.Ye, FDR was proposed by A.Chandra et al, EFDR was proposed by H.Aiman et al and Nine code compressions was proposed by Usha S. Mehta et al. All these are variable to variable run length code. Golomb code, AVR and nine code compressions are discussed in details so that there functionality is clear as the proposed work is based on these codes. The organization of the rest of the paper is as follows: Section II contains the discussions of Golomb and AVR codes. Section III contains the discussion of Enhanced compression code (ECC). Section IV contains the Decompression Architecture. Section V shows some of the Parameter Analysis. Finally section VI shows the Conclusion and Future Work.
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