Test Probes

Page 1

PPT Website: www.equip-test.com Keywords: EOL Fixtures Flying Probe

Title: An Overview about the Flying Probe Body: Flying probes are playing a big part in the electrical and electronic testing world. These flying probes are mostly used for testing medium to low volume production, prototypes, and in boards with accessibility issues. The testing related to flying probe implements the usage of electro-mechanical controlled probes that are used for an easy access to components on printed circuit assemblies (PCAs). These are generally in experiments and testing related to short circuits, open circuits, analog signature analysis and analog components. Classification of Flying probes: 1. First Generation Flying Probe – availed from mid 1990s  Provides single sided with flying test probe on the top side only 2. Second Generation Flying Probe - availed from mid 2000s  Provides double sided with angled probes both on the ends 3. Third Generation Flying Probe  Provided with four or more flying on top and bottom side  Incorporated in different technologies like thermal runaway, boundary scan, etc. 4. Other Flying Probe  For diagnosing defects one or two sided flying probes are connected  For testing printed circuit board, bare board flying probes are used Flying Probe Applications:  4-wired Kelvin measurements and tests  PCBAs for NPI, prototype and low volume testing  Low Value Component testing  Backplane testing  EOL fixtures testings


Turn static files into dynamic content formats.

Create a flipbook
Issuu converts static files into: digital portfolios, online yearbooks, online catalogs, digital photo albums and more. Sign up and create your flipbook.