Surface Newsletter - Summer 2016

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Summer 2016

Surface imaging, analysis & metrology news from Digital Surf

Working with data from scanning electron microscopy?

In this issue Focus on SEM               4 w a ys to get mo re o u t of your elec tro n mi c roscope data p. 2

Research               S c i e nti sts char acte rize n e w wonder m ate ria l s i l i c ene p. 4

Research               C o l l agen degr adation re v e a l ed by cor rela tive i ma g i ng p. 6

Surface metrology Q&A

In this issue, we look at some of the tools available in Mountains® software for the processing and analysis of images and other data collected by SEM users. Read more overleaf

W h e r e should I re a d up o n s ur face m etr olo g y? p. 8

News in brief               Ev e nts & pr oduc t h i g h li ghts

p. 10

Customer story

I mp rovi ng ener gy e ff i c i ency of car climate c o n t r ol p . 11

Comparing spectral data in MountainsMap®

Recommended surface metrology reading from our expert p. 6

p. 8

PLUS We look forward to seeing you over the summer at one of the following exhibits:

Join us on Facebook, LinkedIn and YouTube!

www.digitalsurf.com

Microscopy & Microanalysis

European Microscopy Congress

Japan Analytical Scientific instruments Show

Columbus, Ohio

Lyon, France

Tokyo, Japan

July 24 - 28

August 28 - September 2

September 7 - 9

Booth 1223

Booth 39

Booth 7A-401


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