Summer 2016
Surface imaging, analysis & metrology news from Digital Surf
Working with data from scanning electron microscopy?
In this issue Focus on SEM 4 w a ys to get mo re o u t of your elec tro n mi c roscope data p. 2
Research S c i e nti sts char acte rize n e w wonder m ate ria l s i l i c ene p. 4
Research C o l l agen degr adation re v e a l ed by cor rela tive i ma g i ng p. 6
Surface metrology Q&A
In this issue, we look at some of the tools available in Mountains® software for the processing and analysis of images and other data collected by SEM users. Read more overleaf
W h e r e should I re a d up o n s ur face m etr olo g y? p. 8
News in brief Ev e nts & pr oduc t h i g h li ghts
p. 10
Customer story
I mp rovi ng ener gy e ff i c i ency of car climate c o n t r ol p . 11
Comparing spectral data in MountainsMap®
Recommended surface metrology reading from our expert p. 6
p. 8
PLUS We look forward to seeing you over the summer at one of the following exhibits:
Join us on Facebook, LinkedIn and YouTube!
www.digitalsurf.com
Microscopy & Microanalysis
European Microscopy Congress
Japan Analytical Scientific instruments Show
Columbus, Ohio
Lyon, France
Tokyo, Japan
July 24 - 28
August 28 - September 2
September 7 - 9
Booth 1223
Booth 39
Booth 7A-401