Table Top Atomic Force Microscope (TT-2 AFM) by AFM Workshop

Table Top Atomic Force Microscope (TT-2 AFM) by AFM Workshop The TT-2 AFM meets a wide variety of applications. With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nanometers to microns. This AFM serves as an ideal platform for creating new and innovative instruments.

What TT-2 AFM includes? Have a look at the components of TT-2 AFM: Software Software for acquiring images is created with the industry-standard LabVIEWâ&#x201E;˘ programming visual interface, instrument design environment. There are many functions, including setting scanning parameters, frequency tuning, probe approach, and displaying images in real time.

LabVIEWâ&#x201E;˘ smooth the progress of rapid development for those users seeking to enhance the software with additional special features.

Stage The TT-2 AFM Stage has exceptional thermal and mechanical stability essential for high-resolution AFM scanning. Additionally, its open design facilitates user modification.

EBOX Electronics in the TT-2 AFM are designed around industry standard USB data acquisition electronics.

There are significant functions, such as XY scanning, are optimized with a 24-bit digital to analog converter.

With the analog Z feedback loop, the uppermost fidelity scanning is possible. Vibrating mode scanning is likely with both phase and amplitude feedback using the high sensitivity phase detection electronics.

Image Analysis TT-2 AFM is included with the Gwyddion open source SPM image analysis software. These complete image analysis package with all the software functions necessary to analyze, process, and display SPM images.

Video Microscope A video optical microscope serves three functions: locating surface features for scanning, aligning the laser onto the cantilever in the light lever of the AFM, and facilitating probe approach. The TT-2 AFM includes a high-performance video optical microscope along with the light source, a 3-megapixel camera, microscope stand, and Windows software for displaying images.

Probe Holder/ Exchange The TT-2 AFM operates a unique probe holder/exchange mechanism. With a spring device, probes are held in a place that mates with a probe exchange tool. This combination put together changing probes fast and easy on the TT-2 AFM. Scanning Modes Standard with every TT-2 AFM is vibrating (tapping) modes and nonvibrating (contact) mode for creating topography scans. Additional modes are lateral force imaging and phase mode imaging included with the product. Any scanning mode implemented with a light lever AFM is possible with the TT-2 AFM. Frequency of a cantilever is readily measured with the window above the resonance. Furthermore, the phase characteristics of the probe-sample interaction can be captured.

To buy top quality Table Top Atomic Force Microscope (TT-2 AFM), you can contact AFMWorkshop.

AFMWorkshop provides a 100% satisfaction guarantee. If their AFMs can't run your application, they will refund you the full purchase price. In addition, AFMWorkshop's Atomic Force Microscopes are backed by a two-year, return-to-factory warranty.

For more information, feel free to visit https://www.afmworkshop.com.