MARKET OVERVIEW
A Wafer Defect Inspection System is designed to detect physical defects (foreign substances called particles) and pattern defects on semiconductor wafers. The primary function of this system is to locate the position coordinates (X, Y) of defects on the wafer surface, enabling manufacturers to identify issues in the wafer’s structure before the semiconductor devices are produced.
MARKET SIZE & GROWTH
• The global Wafer Defect Inspection System Market was valued at USD 6,855 million in 2023.
• It is projected to reach USD 12,670 million by 2030.
• The market is expected to grow at a CAGR of 10.4% during the forecast period.
