![]()
Semiconductor test probes are small devices used in the testing of semiconductor components, such as integrated circuits and transistors. These probes typically consist of a small metal needle or wire that is used to make contact with specific points on the semiconductor device being tested. The probe is connected to testing equipment that measures various electrical properties of the device, such as resistance, capacitance, and current flow.
Semiconductor test probes are critical tools in the manufacturing and quality control of semiconductor components, as they allow engineers to verify that each component meets specific performance and reliability requirements.
The global Semiconductor Test Probes market was valued at US$ 642.8 million in 2022 and is projected to reach US$ 987 million by 2029, at a CAGR of 6.3% during the forecast period. The influence of COVID-19 and the Russia-Ukraine War were considered while estimating market sizes.
Elastic Probes
Cantilever Probes
Vertical Probes
MEMS Probe