Semiconductor OCD Measurements System Market was valued at 1033 million in 2024 and is projected to reach US$ 1810 million by 2032, at a CAGR of 8.6% during the forecast period
Report Studies
• The global Semiconductor OCD Measurements System Market was valued at 1033 million in 2024 and is projected to reach US$ 1810 million by 2032, at a CAGR of 8.6% during the forecast period.
• Semiconductor OCD measurement systems are advanced metrology tools that enable non-destructive, high-precision measurement of critical dimensions in semiconductor manufacturing. These systems utilize optical scatterometry techniques to analyze film thickness, line width, sidewall angles, and 3D structural morphology at various production stages—particularly after development (ADI) and etching (AEI) inspections. They support advanced nodes including FinFET, NAND flash memory, and sub-7nm technologies, delivering vital process control for foundries and IDMs.
By Technology Nodes:
• The market is segmented based on technology node into:
•32nm and Above
•2Xnm Technology Node
•1Xnm Technology Node
•7nm, 5nm or Higher Technical Nodes
By Water Size:
• The market is segmented based on wafer size into:
• 200mm Wafer
• 300mm Wafer
• Others
• KLA Corporation (U.S.)
• Onto Innovation (U.S.)
• NOVA (Israel)
• Nanometrics Incorporated (U.S.)
• n&k Technology, Inc. (U.S.)
• Scientific Computing International (U.S.)
• Shanghai RSIC (China)
