Joint sfam and ASM Meeting BACTERIAL RESISTANCE to ANTIBIOTICS and DISINFECTANTS New Orleans, USA 23 - 27 May 2004 SfAM and the American Society for Microbiology (ASM) are jointly organizing two sessions dedicated to bacterial resistance to antibiotics and disinfectants at the ASM 104th General Meeting in New Orleans on 23-27 May 2004. This programme aims to expand from the first conference on biocide and antibiotic resistance in bacteria organised by the Society in Swansea in the UK in July 2001. The role of misuse of antibiotics in proliferating antibiotic resistance is appreciated, however, the potential effect of biocide use in clinical and domiciliary environments on the emergence of antibiotic resistance is less understood. In addition, the extensive, and often improper, use of biocidal products has been claimed to exacerbate the spread of antibiotic resistance. Several institutions in the US and UK have recognized the problem and have called for a better understanding of the mechanisms which might lead to possible cross-resistance between antibiotics and biocides. While this issue is recognized by some working at the boundaries of clinical and environmental microbiology, it merits greater recognition by our professional society and society at large; ultimately the end user of many biocidal products. A symposium session entitled “Biocide and antibiotic resistance in bacteria: policies and issues: where do we go from here?” will explore the issues and policies related to the use of biocides in relation to bacterial resistance to both biocides and antibiotics. This will be followed by a colloquium session entitled “Biocide and antibiotic resistance in bacteria: an update” which will present the latest scientific evidence of possible linkage between biocide and antibiotic resistance in bacteria.
Proposed Programme 14.30 - 17.00
Wednesday 26th May 2004 Room 207, New Orleans Convention Center, 08.00 - 10.30 Symposium: Biocide and antibiotic resistance in bacteria: policies and issues: where do we go from here? Conveners: J-Y Maillard (University of Brighton, UK) and M S Favero (Advanced Sterilization products, Johnson & Johnson, Irvine, USA).
Similarities and differences between bacterial responses to biocides and antibiotics. A D Russell (Cardiff University, Wales, UK).
Use of disinfectants in health-care facilities: a cause for concern? W A Rutala (University of North Carolina, USA).
Colloquium: Biocide and antibiotic resistance in bacteria: an update Conveners: M S Favero (Advanced Sterilization products, Johnson & Johnson, Irvine, USA) and J-Y Maillard (University of Brighton, UK)
Biocide and antibiotic resistance in bacteria: the need for an update. J-Y Maillard (University of Brighton, UK).
Target sites for biocidal agents: primary vs. multiple target sites revisited. S P Denyer (Cardiff University, Wales, UK).
Biocide usage and antibiotic resistance: linkage in the clinical and domestic environments? S B Levy (Tufts University School of Medicine, Boston, USA).
Clinical significance of the emergence of bacterial resistance in the hospital environment.
Efflux mechanism: current knowledge: a major mechanism involved in bacterial resistance to antimicrobials.
B D Cookson (Health Protection Agency, London, UK).
Prospective bacterial targets as a means of overcoming bacterial resistance to biocides and antibiotics: the future of antimicrobials.
K Poole (Queen’s University, Kingston, Canada).
D J Payne (GlaxoSmithKline, Collegeville, USA).
P Gilbert (University of Manchester, UK).
Antibiotic and biocide resistance in bacteria: reality or theory? A summing up. M S Favero (Advanced Sterilization products, Johnson & Johnson, Irvine, USA).
Bacterial biofilm and resistance to antimicrobial agents: a better account of real life situations. There will be a call for posters in this area by the ASM organiser. Please check the ASM website (address below) for further details.
Thank you SfAM would like to thank Advanced Sterilization Products (a Johnson & Johnson Company, Irvine, CA), the Soap and Detergent Association and the Cosmetic, Toiletry, and Fragrance Association (SDA/CTFA, Washington, DC) for their generous contributions which will enable leading experts to travel to New Orleans to attend this meeting. Further information about this meeting can be obtained from the Society Office and from the ASM website at: www.asm.org/Meetings/Index.asp?bid=470
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December 2003
www.sfam.org.uk