1 minute read
Featured Webinar
by Protochips
FUSION AX: Amp Up Your Devices, Studying Electronic Devices with In Situ TEM
We were thrilled to kick off the ‘Amp Up Your Devices’ webinar series with an insightful session led by our own Dr. Zayna King and Dr. John Damiano. This inaugural webinar spotlighted the Fusion AX as a comprehensive in situ TEM solution tailored for the electrical and electrothermal characterization of a wide range of materials, including nanoelectronics, semiconductor devices, and various 2D materials.
Dr. Zayna King opened the session with an introduction to the Fusion AX system, showcasing application examples that demonstrate how the system can help you develop more reliable, durable, and high-performing nanoelectronics with reduced power consumption.
Following this, Dr. John Damiano delved into the fundamentals of in situ electrical characterization. He highlighted how in situ measurements differ from ex situ approaches, the critical factors for successful in situ electrical experiments, and shared fascinating examples of electrical characterization in action.
Stay tuned for the next installment in the series, where we continue to explore cutting-edge solutions to advance your research and innovation!
