Outlier Detection in Semiconductor Testing

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Wafer Yield Management Manufacturing Yield Wafer Testing "OutlierDetectionFor QualityImprovementin SemiconductorTesting." – yieldWerx
System Outlier detection is a method commonly used in semiconductor testing to identify dies that deviate significantly from the norm in terms of their performance or behavior map merge semicon wafer map software GDBN PartAverage Test StaticPAT DynamicPAT ZeroDefecttools semiconductor Clusterfailssemiconductor rootcauseanalysisin semiconductor yieldanalytics SPATsemiconductor 1 2 3. 4. 5 Semiconductor Production yield Analysis Software Semiconductor SPC Software Read more at yieldWerx about yms solutions.
Yield Management
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