Catalogue

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Testing Life’s Ideas

Innovative Functional Test Solutions

Distributors Catalogue 2006 Platforms and Applications Version D5 – June 2006

©2006 All rights reserved. CIMTEK Ltd.


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CIMTEK’s goal is to ensure product performance through complete test solutions, working with our trusted partners and key distributors worldwide.

Automotive

Consumer Electronics

Telecom

Avionics

Emerging Technologies

Innovative Electronic Functional Test Solutions Test Equipment, Software and Components Global Service, Training and Support Proven Solutions, Experience and Expertise

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Offering CIMTEK Project Management for customized or standard-platform solutions:

Experienced engineers across all fields Proven methodology – standard certification Milestones tracked and escalated when required Manage scope to reduce risk Global partnerships with major OEM’s and CM’s

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Table of Contents Standard Platforms: CIMTEK Compact Pro*..................................................................................................... 6 CIMTEK Exordia-R* .......................................................................................................... 8 CIMTEK DV Tester............................................................................................................ 9 CIMTEK Cluster Calibrator............................................................................................. 10 *System Options Overview:............................................................................... 11 Functional Modules - Analogue ............................................................................ 12 Relay Modules ......................................................................................................... 13 Functional Modules - Digital.................................................................................. 14 Functional Modules - Communications................................................................ 15 General Application Modules................................................................................. 16 Loads Cards ............................................................................................................. 17 Impedance Test Modules ...................................................................................... 18 Software Options........................................................................................................ 18 CIMTEK Application Solutions:.............................................................................. 21 The CIMTEK TPMS...................................................................................................... 21 The CIMTEK ACM........................................................................................................ 22 Training Options ......................................................................................................... 23 Course Benefits .......................................................................................................... 23

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The CIMTEK Compact Pro Functional test doesn’t have to be expensive – for US $40K you have all the benefits: ¾ flexible functional test with proven software and proven results ¾ training and local support ¾ select and buy only what you need ¾ expand the systems capability as your requirements grow ¾ leverage board test and boundary scan modules from CIMTEK and also have a combinational tester -- eliminating the need for separate test stages while reducing your total cost of test.

Perfect for high product mix at any product volume, the CIMTEK Compact Pro is CIMTEK’s newest automatic test system designed to enable faster, more flexible and convenient application development and testing. Functional Test doesn’t have to be expensive, with the Compact Pro range from CIMTEK you only buy what you need, and grow the systems capability as your requirements grow. For as little as $40K USD you can be up and running with a CIMTEK Compact Pro functional tester. But the Compact Pro is more than just a functional tester, using board test and boundary scan modules from CIMTEK the machine becomes a combinational tester, eliminating the need for separate test stages, thus reducing the total cost of test. The Compact Pro provides efficient and effective functional and combination test for low to high volume applications. In developing the Compact-Pro, the team at CIMTEK has built on decades of experience to create an unrivalled test system. At the heart of the system is the Windows XP based software providing a true multitasking environment. This flexible and robust system is supplied in 8-slot Compact-Pro or 21-slot Exordia as standard. The test rack has been developed with no mains wiring, which enhances noise immunity, and improves measurement integrity and repeatability.

The CIMTEK Compact Pro is a modular system designed to adapt to your specific needs for height, width, and depth. The new flexible design allows for re-use of your existing

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CIMTEK Compact Series fixtures and test modules. Ask us how we can help you to extend your ROI by getting more from your investment in existing fixtures.

Features Option 8 Slot 21 Slot Benchtop 19” Rack PXI Powerful Test Executive High Power Options Compatible with Exordia, 3900 fixtures Compatible with Compact Series Fixtures Board test modules Testjet® Boundary Scan

Compact-Pro ● ● ● ● ● ● ● ● ●

Exordia-R

Exordia-X

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Testjet® is the registered trademark of Hewlett Packard

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Extensive range of test modules (cards) High-speed, real time digital mode Digital simulation Data acquisition including Waveform capture Standard and customer configurable load modules Communications protocol simulation Remote control over the LAN, WAN or the internet with optional utilities Integrated safety circuitry and ergonomic design Optional vision system to inspect components, LED's (colour verification), and product configuration Automatic or manual loading/unloading Configurable operator and engineering GUI’s, easy-to-use trouble-shooting functionality, security, integrated data collection and reporting

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Maximise test station throughput and automatically load correct test programs Re-use of the system through its flexible platform that can be quickly reconfigured for different UUT/DUT types/variants Fast and simple to program, debug and modify thereby reducing time-to-market Scalability the platform can be adapted for increased throughput capability Maximise test station up-time using rapid change-over test fixtures Proven, evolved platform ensures a higher level of availability, reliability and uptime Intelligent design using exchangeable fixtures to help decrease costs Seamless upgrade of systems as your resource requirements grow Calibrated on-site to minimise line down-time User definable features including, programmable power supplies, high-speed data acquisition hardware, serial communications interfaces, relay cards, communication protocol converters, load cards, analogue and digital I/O black & white or colour vision systems. Includes the latest version of our Windows XP system software, a high performance PC and a future proofed PCI controller card which ensures high speed communication for greatly improving transfer speeds, resulting in a higher test speed.

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The CIMTEK Exordia-R The CIMTEK Exordia-R - a21 slot functional automatic test system for less than $75,000 US.

¾Flexible and powerful functional test ¾Proven software and proven results ¾Training and local support ¾Modular system designed to adapt to your specific needs for height, width, and depth. ¾Allows for re-use of your existing CIMTEK Exordia Series fixtures and test modules. ¾User definable features ¾ High speed communication for greatly improving transfer speeds, resulting in a higher test speed.

Combine power and flexibility the CIMTEK Exorida-R which enables faster, more flexible and powerful application development and testing. The Exordia-R is a modular system designed to adapt to your specific needs for height, width, and depth. The new flexible design allows for re-use of your existing CIMTEK Exordia Series fixtures and test modules. User definable features including, programmable power supplies, high-speed data acquisition hardware, serial communications interfaces, relay cards, communication protocol converters, load cards, analogue and digital I/O black & white or colour vision systems. The Exordia-R includes the latest version of our Windows XP system software, a high performance PC and a future proofed PCI controller card which ensures high speed communication for greatly improving transfer speeds, resulting in a higher test speed.

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The CIMTEK DV Tester ¾ generic test platform - flexible to offers low total cost of ownership. ¾ proven software and proven results ¾ training and local support ¾ select and buy only what you need ¾ expand the systems capability as your requirements grow

The CIMTEK DV Tester is our generic test platform can be used for exercising of electronics modules. The DV Platform (“DVSpan”) is capable of performing high throughput exercising and environmental testing of electronic control modules. This tester has been configured for use in several types of modules from low power to high power, involving DC, AC or RF requirements. A configurable load-box concept is used to minimize instrumentation overheads yet maximize communications and response times. Select from 6 to 12 independent, parallel exercising and monitoring test heads with an optional single-head functional test head, removable custom load boxes for different module types and an option to control chamber cycling via award winning ChamberView™ softwarerepeatability.

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The CIMTEK Cluster Calibrator

Flexible platform for calibrating and verifying to the strictest standards.

The CIMTEK Cluster Calibrator is a flexible test platform for instrument cluster calibration. (“CimFlex”) is capable of performing production end-of-line and calibration or verification testing of automotive instrument cluster modules. This platform has been used for over 100 different instrument cluster variants and is based on modular, flexible and scalable components that can be customized to meet varying customer requirements. Testing to government regulatory specifications, this multi-nest system was designed to perform gage calibration and parametric testing of automotive instrument clusters while maximizing instrumentation efficiencies, reducing station downtime and increasing product throughput. Speed end-of-line (Lean Cell) production testing with proven testing designed for multi-nest, asynchronous operations in a “Lean Cell” production environment. Features include: •

Rely on up to four, independent, easily removable nests, 2 active in front of the operator and 2 in the vision position for calibration, provides minimal investment for add-on products.

Available in two standard configurations: 4-nest high volume and 2-nest mid-volume test station.

Barcode scanning capability is also available for automatic or manual product variant input and/or serial number tracking for information systems.

Integrated safety controls include load/unload product sensing and an auto-AC disconnect operator light curtain.

Pre-engineered complex camera arrays with adjustable, flexible camera mounting systems, plus vision testing: calibration, verification, ISO symbol verification, odometer checking, message center verification, gage vibration and parametric testing.

Each system includes multiple high-resolution cameras per nest used in calibration process covering 100% of the potential product area to handle a wide variety of products.

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DT80 DTU ED24 GP32 HL15 HP2 ID80 ICO IZ80 IZ96 MX64 Off Line RH24 RH48 RH96 RM96 RR96 SC7 TJ64 UP8 VI4 VIC VS16 Waveform ZT80 ZT96

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Software

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Switching

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Power Supply

Timing MMT

AD32 AG4 AL31 AS8 BSG2 CC1 CL32 DL32 DSM

Voltage Current MMT

AB64

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Stimulus

30 Ch Analogue Buffer Module 64 Ch Analogue Buffer Module Advanced Digital Module Arbitrary Generator Module Active Load Module Analogue Sampling Module Boundary Scan Module CAN Communication Card Custom Load Module Discrete Load Module Digital Synchronisation Module Digital Test Module Digital Test Unit Event Detector Module General Purpose Module Heavy Load Module High Power Router Isolated Digital Test Modules In Circuit Optimiser Isolated Impedance Test Module Isolated Impedance Test Module Mulitplexer Module Off Line Programming High Current Relay Module High Current Relay Module High Current Relay Module Mercury Wetted Relay Module Reed Relay Module Serial Communication Module TestJet Module User Power Module Voltage Current Module Voltage Current Controller Voltage Source Module Waveform Display Impedance Test Module Impedance Test Module

Continuity

Module Name

AB30

Pin Check

Product Code

System Options Overview:

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Functional Modules - Analogue AB30/64 – Analogue Buffer Module The CIMTEK ATE system offers an optional Analogue Buffer Module (AB30 or AB64) to provide precision measurement of AC volts, DC volts, current, frequency, event period and event counting. The ABM has 30 or 64 measurement pins to connect to the UUT. Multiple ABM’s can be installed, each taking one card slot, thereby increasing the number of pins available. AG4 – 4 Channel Arbitrary Waveform Generator The Arbitrary Waveform Generator (AG4-39) with 4 output channels comprises 4 separate, remote sensed, ground based, arbitrary generators intended for use with the 3900 Series of ATE systems. Each generator has 64K depth of memory which can be clocked out at a sampling rate of up to 32 MHz. A number of standard waveforms, Sine, Ramp and Square are available. Multiple AG4-39 modules can be placed in the rack, each module occupying a single module slot. AS8 – 8 Channel Analogue Sampling Module The AS8-39 is a sophisticated analogue data capture module that is capable of independently sampling the incoming data on each of the 8 channels at programmable rates up to 40MHz into the RAM behind each pin. Each channel has independent timebase and trigger facilities. The range on each channel is programmable in 1-2-5 steps from 50mV up to 200V. The module can be considered to be an 8 channel storage oscilloscope and allows analogue signals to be monitored, measured and compared or related to each other.

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ED24 – 24 Channel Event Detector Module Detecting random events, analysing complex waveforms over long time periods and accurately picking out the timing from asynchronous digital signals can be taxing on test resources. The ED24 has the capability to simplify them considerably. The Event Detector Module compares the voltage on its 24 input channels against a programmable reference. When the threshold is crossed, the module records the time at which this has happened and the direction of the transition. Being free-running, it is very simple to use. Results are returned as real time values for added convenience. Capable of storing over 250,000 events, the module can monitor performance with long intervals between uploads of data to the controller. VI4 – 4 Channel Voltage/Current Module The VI4 comprises four identical, fully floating voltage sources with separately specifiable positive and negative current limits. Each source is bipolar in voltage setting and both of its output nodes, the output and the reference (floating ground), are available at the Test Interface Connector. Voltage and current monitoring is built in. VS16 – 16 Channel Voltage Source The 16 channel Voltage Stimulus Module (VS16-39) is a fast, precision, 16 channel constant DC voltage, remote sensed module. Each channel is independently controlled and voltages between ±16V DC can be delivered to the Unit Under Test. All channels are relay isolated and have an individual analogue measurement channel per output built in. This module is ideally suited to applications where a large number of sensors need to be simulated for example automotive or industrial process control.

Relay Modules RH24, RH48 and Rx96 – Relay Module The range of Relay Modules gives the user a general purpose, high current or mercury wetted switching matrix for routing signals, loads etc. Consisting of 64 relays and 96 operational pins, these modules provide the test engineer with a wide range of test signal switching options and with every relay contact individually programmable, users can quickly configure their application specific switching requirements. The RH96 offers high current switching and carrying capability whereas the RR96 provides general purpose

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fast acting relays for normal switching requirements. For higher power switching, for example in automotive applications, the RH24 and RH48 modules are available with 24 and 48 high power relays fitted respectively.

MX64 – Multiplexer 8 to 64 way Bi-directional To complement the range of standard relay modules available a dedicated switching matrix is available. The MX64 can be configured as an 8x32 or an 8x64 way bidirectional matrix module. The module can be used to multiplex stimulus or measurement resources to a number of Unit Under Test Pins or to connect and disconnect loads to a UUT pin along with other resources simultaneously. The module consists of 512 relays that are independently controllable or can be controlled in groups of contacts up to 32.

Functional Modules - Digital AD32 – Advanced Digital Module CIMTEK’s AD32-39 is a sophisticated digital I/O module capable of producing/collecting data at rates of up to 50MHz from/into its RAM backed pins. This advanced functionality, combined with the AD32-39's inherent ability to link with simulators such as Lasar, makes the 3900 Series ATE a formidable digital tester reaching far beyond the capability previously associated with Low Cost ATE. BSG2 – Integrated Boundary Scan Module High-density multilayer PCBs with fine pitch surfacemount devices are very difficult to access for testing with the traditional ‘bed-of-nails’ fixture. Cost and reliability are also affected: fixturing costs rise with increasing fixture pin density, while reliability decreases resulting in more test down time. For this reason it is becoming increasingly important for manufacturers to build test capability into their products. One way of doing this is by using Boundary Scan (IEEE 1149.1) devices. Despite the four or five additional pins required by each boundary scan device, the product benefits from reduced fixturing costs, increased fixture reliability, and improved test access. With the Cimtek boundary scan solution, fixturing is simplified, and hence cheaper. Boundary scan test algorithms are called from within an ATE test program. In addition to testing the boundary scan devices, boundary scan pins can be set to drive or sense test

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patterns, enabling the ATE to test non-boundary scan circuitry via Boundary Scan devices. DT80 – Digital Test Module The Digital Test Module (DT80-39) provides a high pin count digital test capability. Each DT80-39 provides 80 channels which can be individually designated under software control to be Drive, Sense or Tristate, including the ability to perform signature analysis on every pin. In common with other 3900 series modules the DT80-39 provides comprehensive cross triggering facilities allowing full integration with other test resources within the system.

Functional Modules - Communications SC7 – Serial Communication Module The Serial Communications Card 7 has seven flexible, fully independent communications channels that can be used in Automotive and other applications that require real-time serial communications between the ATE and the UUT. It is particularly applicable to Ford, GM, Visteon, Delphi, Bosch, Siemens, Motorola, TRW, and others. This module takes up a single slot in the test rack and has a full suite of integrated software. The communication modules currently available include: CAN Standard Extended Single wire – GM LAN – CAN J1850 10 KHz and 40 Khz Ford SCP GM Class 2 (Chrysler) UART KW2000 ISO9141-11 UBO ACP SCAD RS485 The modular approach means that new protocols or adaptations to existing protocols can be easily and quickly achieved.

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General Application Modules CT96 – Customer Test Module Custom electronics can be easily interfaced with the tester through the Customer Test Module (CT96-39). The CT96-39 provides a large prototyping area, allowing access to the address bus, data bus, counter timer lines and analogue measurement bus, as well as the system power rails, thereby providing a powerful way of controlling custom electronics. Your custom design is further enhanced and integrated through the WKC programming language, allowing the user to create their own unique functions and to add them to their library. GP32 – General Purpose Module The CIMTEK ATE offers an optional General Purpose Module (GP32-39) which makes use of Omni-Pin technology and provides In-Circuit, analogue functional and digital functional test capabilities on each of its 32 pins, offering totally universal test performance. Any pin can be individually programmed to any function at any time. The Omni-Pin technology is ideal for both conventional and surface mount boards where full access via bed of nails may not be available. This module provides comprehensive, future-proof test facilities previously unknown in the low cost ATE field. HP2 – High Power 2 Channel Router The HP2-39 is a dual width 3900 module that is capable of supplying and switching high currents and voltages to the UUT. Each HP2-39 supports 2 power units and can route each unit to one or more of its 8 output channels. Both power units can be on and routed simultaneously. Up to 3 HP2-39s can be contained within the test rack which means that up to 24 high power rails can be presented to the UUT. UP8 – User Power Module The 3900 Series ATE provides for supply and control of power to the Unit Under Test (UUT).This is achieved using a simple modular structure. The ATE is configured by the user with a selection of up to 8 supplies, as appropriate for all test requirements. Control and distribution to the test fixture is achieved with a single test module, the User Power Module (UP8). All power supplies are floating, relay isolated and have remote sensing capability to simplify fixture design. In addition the UP8-39 offers In-Circuit (including continuity testing), voltage and current measurement capability to minimise requirements for other test modules and to simplify fixture wiring.

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VIC – VI Controller The 3900 series ATE provides for direct voltage programming of high voltage or current power supplies, including 4-quadrant power VIs. This is achieved using a factory fit system module. The ATE can be configured with up to 8 user selected power units as appropriate for the UUT test requirements. Power unit outputs are routed to the UUT via the HP2 test rack module. Any analogue signal from the test bus can be routed to the VIC as a programming voltage for the attached power units. The VIC utilises a remote box at the power unit to minimise the voltage programming wiring and includes an identifier to allow the limits of the power unit to be known.

Loads Cards Load Modules The range of Simulated Load Modules for the Exordia Series ATE system gives the user a configurable method of connecting multiple loads to a Unit Under Test (UUT). Load configurations for various products can also be accommodated in the dedicated load rack located at the base of the Exordia system. The load rack modules are available at the mass interconnect via a 104 Way 13A connector and a 165 Way 3A connector. DL32 – Discrete Load Modules Consists of 32 channels of simulated switch loads. Each channel has a 47W and a 51kW resistor in parallel, the 47W being connected to the output pin via a relay. The 47W resistor is used to simulate a ‘dirty’ closed switch and the 51kW resistor is used to simulate a ‘leaky’ open switch. The common point of each resistor pair can be switched to Vbatt or Ground CL32 – Customer Load Modules 32 channels of user supplied resistive load capability. The module has space for the user to insert up to 32 25W, 10W or ¼W resistive loads. Each load is isolated from the pinface via a relay and the other side of the load can be switched to Vbatt or Ground. HL15 – Heavy Load Module 15 channels of resistive, inductive or resistive & inductive load capability. Each channel has space for a 25W resistor and a 1¼ inch diameter toroidal inductor. Four of the channels can accommodate a 50W resistor and all channels include a 50mW sense resistor. The output of the sense resistor is buffered, amplified and multiplexed to the ATE Test Bus Backplane. Each channel can be isolated from the UUT and the load can be connected to Vbatt or Ground.

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Impedance Test Modules IX80, IZ96, ZT80 and ZT96 – Impedance Test Module The Impedance Test Modules provide the means to measure accurately, and identify, faulty resistors, capacitors, inductors, transistors and diodes on a PCB. The primary use of the Impedance Test Module is to identify manufacturing defects after the soldering stage. Each of the channels can act as a Driver, Sensor, Guard or be Tristated. Any number of Impedance Test Module modules can be fitted in the CIMTEK ATE in any slot up to the maximum number of 21 giving 2016 MDA in an Exordia. TJ64 – TestJet Module 64 Channels CIMTEK offers HP TestJet Technology* on the CIMTEK Exordia board test systems. A licensed, industrystandard package, TestJet Technology* enables users of CIMTEK systems to enhance them to automatically detect SMT opens in record time. Combine that with automatic self learn and diagnosis of faults to the pin level is why 9 of the world’s 10 largest electronic manufacturers use TestJet to eliminate SMT opens, the most common fault. TestJet Technology provides fast learn, virtually no debug and an extremely low false failure rate reducing development time and on-going expense. *HP TestJet technolgy is protected under US patent # 5,254,95

Software Options System Software for XP ATESys for XP, CIMTEKS’s own integrated test executive and development environment. This is a rapid development and deployment package with minimum complexity whilst remaining very flexible. Description The ATE software is run on an operating system split into two discrete areas. • Program Development Environment (PDE) • Operator Test Environment (OTE) Program Development Environment The Program Development Environment is the software which assists in developing the test programs, the PDE includes the following software packages:• Project Manager • Program Generator

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• Assist and Browse • Electronic Programming Manual • Text Editor • Debugger • ToolBox • Configuration and Security • Test Manager • Waveform Display Operator Test Environment The Operator Test Environment is used to select and run test programs for use on the production line. The OTE includes the following software:• Project Manager • Test Manager Projects can be configured to autorun or called by wiring the correct patterns on the program name reader port (PNR) hence launching the application that goes with the fixture. CIMTEK CimTest – for high volume functional test • CimTest Test Executive is a VXI plug&play compatible test executive for Microsoft Windows XP platforms. This product is a powerful collection of visual development and run time tools that takes test generation and execution environment to the next level. • CimTest Test Executive is focused on the automotive industry’s need for a high performance, flexible, easy to use and customize, multiple head (nest) automated test execution environment. This test executive is capable of handling every task on every stage of the product development, design validation, high volume production and quality control including environmental testing. • The set of CimTest tools is based on industry standard Microsoft Windows XP environment with VXIplug&play drivers for instrumentation control, plus CIMTEK's experience in the field of developing high performance ATE (Automated Test Equipment). CIMEK Chamberview software used to improve your QC operations by automating and centralizing control of multiple chambers. ChamberView® runs under the Microsoft Windows environment and allows the user to control, program, and view data from one or many environmental chambers, regardless of chamber manufacturer or the brand of controller. ChamberView® was designed to remove the difficulty of having to learn several different control packages and programming styles in order to use different environmental chamber controllers. It is an easy to learn, easy to use and easy to understand application which uses

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a non-programming approach to environmental chamber control. Technical Specifications - Main Features

• Simultaneous multiple environmental chambers control and monitoring system • Number of chambers controlled limited only by the size of RAM and communication ports requirements • Easy to use self explanatory environmental test specification forms • Library of user defined test specifications (recipes) independent of the chambers • Password system to restrict operators access to the test specification • Self documenting system for all specifications entered • Test specifications (recipes) reusable across all chambers • Jobs scheduler to optimize chamber usage • Historical data logger with hard copy capability • Remote access, supervising, and support capabilities • On alarm supervisor paging capabilities • Built in power recovery system • On line and context sensitive help to guide operators • Cold/Hot soak, Soak At, Segmentation synchronization with testing (if available) • User defined set of alarms

CIM Software Development Kit (SDK) The CIM SDK provides low level access to the CIMTEK 3900, Compact or Exordia series of ATE testers. This access is provided by a ‘C’ level API which allows projects to be constructed in most third party programming environments. Examples of the uses for the CIM SDK are developing a custom user interface and accessing other technologies such as ODBC databases. Supported Development Environments The CIM SDK should work with most C/C++ compilers that accept library files generated by Visual C++. It has been successfully used in the following environments. • Visual C++ 6.0 • Visual Basic 6.0 • National Instruments Lab Windows/CVI 6.0 • National Instruments TestStand In-Circuit Optimiser (ICO) The In-Circuit Optimiser (ICO) is a standard software tool for Compact MDA users who intend writing In-Circuit test programs. The ICO provides a graphical environment for entering circuit descriptions easily; analysing that data for testability; generating test programs; optimising test programs for effectiveness and fault coverage; and printing out results, messages, and documentation. ICO can accept circuit data from CAD via a suitable package.

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CIMTEK Application Solutions: The CIMTEK TPMS CIMTEK Tire Pressure Module Test System ¾ Flexible and customizable design ¾ Base solution includes main control rack, and four Low Frequency (LF) transmitter / Radio Frequency (RF) receiver pairs. ¾ System is expandable up to 32 LF/RF pairs ¾ Includes custom designed LF amplifier/antenna tailored to meet critical power and radiated field pattern requirements utilizing advanced CIMTEK Cross-Talk Eliminator ¾ Receiver/decoder designed to eliminate cross talk ¾ Tailored Encoded LF signals ¾ RF receiver receives and decodes encoded TPMS signals (Manchester, etc.) in either Frequency Shift Keying (FSK) or Amplitude Shift Keying (ASK) modulation formats. ¾ Receiver operates at either 315 or 433 MHz. ¾ Allows automotive manufacturers to keep the cost of test low while detecting product failure ¾ Reduce ROI due to sturdy and expandable design ¾ CIMTEK Certified and designed to resist water, oil, dust, vibration, and minor impact ¾ Built in diagnostics to allow users to easily assess system performance from both the controller screen and the antenna stands. ¾ LEDs on the antenna stands indicate as Power, LF Transmit O.K., Receive Signal Strength Level., RS-232 Activity, and Data Integrity.

CIMTEK's Tire Pressure Monitor System Test Platform offers Automotive electronics manufacturers a complete solution for testing and configuring their TPMS systems. Benefits of the CIMTEK TPMS Test Platform: Decreased costs. Manufacturers that are able to detect product failure early in the manufacturing process ensure their OEM’s do not need to reject failed products or incur end user warranty claims. CIMTEK offers test strategies designed to reduce costs while improving quality. Complete and flexible solutions. CIMTEK offers solutions for a wide range of testing needs, from Design Validation, through to complete Production Functional Test. Improved ROI. CIMTEK passes along design savings directly to the end customer. Our design is based on proven CIMTEK IP.

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The CIMTEK ACM CIMTEK Airbag Control Module ¾ Leverages NI PXI cards and uses an Airbag tailored unique load switching subsystem to effectively handle a wider variety of load demands enhancing PXI capability. ¾ Logging of all test results in real-time. ¾ CIMTEK IP ensures rapid hardware connectivity and quick interchangeability to any type of airbag sensor. ¾ Permits multiple test sequences for multiple module testing. ¾ System provides multiple DUT testing with true multithreading capability. ¾ Test results for each module are displayed independently while the program maintains separate report streams for each unit under test (UUT). ¾ Handles complex testing and extends the measurement range by conditioning the signals as necessary. ¾ Supports NI LabWindows/CVI and NI TestStand

The CIMTEK Airbag Control Module Test Platform™ (ACM Test Platform) offers Automotive electronics manufacturers a customized solution without the custom costs. Benefits of the CIMTEK ACM Test Platform: Decreased costs. Manufacturers that are able to detect product failure early in the manufacturing process ensure their OEM’s do not need to reject failed products or incur end user warranty claims. CIMTEK offers test strategies designed to reduce costs while improving quality. Complete and flexible solutions. CIMTEK offers solutions for a wide range of testing needs, Design Validation, through to complete Production Functional Test. Our ACM Test Platform can be re-purposed, and is re-usable and adaptable to new test situations at the customer’s site. The range of test applications include: Durability Exercisers, Shake Test, Performance Test, Roll Over Test, and Final End of Line. Improved ROI. CIMTEK passes along design savings directly to the end customer. Our design is based on proven CIMTEK IP. Over 15 years of Airbag experience has resulted in a test system that is both flexible and re-usable, increasing your ROI with each new project deployed. The CIMTEK ACM Test Platform™ is the most cost-effective solution to ACM test challenges which incorporates NI PXI, and CIMTEK proven experience.

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Training Options Basic Training Course Benefits CIMTEK Automatic Test Equipment (ATE) offers tremendous flexibility and a huge variety of options. This course is designed to provide Engineers with fundamental ATE hardware knowledge and programming skills which can be immediately put to practical use. The course provides basic theoretical knowledge for programming the CompactPro/Exordia ATE, reinforced by extensive hands-on exercises which will provide the experience to enable you to unlock the CIMTEK ATE's flexibility. You Will Learn How To • Identify a module lineup • Understand and avoid common fixture errors • Write, Compile and Debug test programs • Optimise the performance of the system • Develop programs using standard functions • Use the tools available for speedy development Maintenance Training Course Benefits The Exordia Automatic Test Equipment (ATE) offers tremendous flexibility and a huge variety of options. Support for this equipment in a demanding Production environment may need to be instantaneous. Therefore on site, trained engineers become a requirement. This course provides a comprehensive practical knowledge of the Exordia ATE, both Hardware and software reinforced by extensive hands on exercises which will provide the experience required to successfully fault find your equipment. You Will Learn How To • Safely disassemble and reassemble the system • Troubleshoot the system to module level • Install and calibrate a system • Optimise the performance of the system • Understand the measurement principles • Recognise common faults and mistakes

Terms and conditions

CIMTEK standard terms and conditions of sales apply. Payment terms: 30 days net Prices: US excluding taxes, packaging and delivery Delivery: TBD from receipt of order. Validity: 120 days from September 1, 2005.

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Issue: June 2006


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