PRODUCTION BOARD TEST
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production
TERADYNE.COM/PBT © Teradyne 2020. All rights reserved.
The TestStation system family is easily configured to any volume, test complexity and automation requirement for today’s electronic manufacturing, with system form-factors optimized for panelized, single piece and large PCBA test. Each system can support common pin cards, test software, power supplies and feature options.
In-Line Systems
Handler
Large Format
Multi-Site
Multi-Site
LH/LHS
TSI 51
TSI 52
TSI 161
Offline Systems
LX/LX2
Test Insert for Automation
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 2
Do More with Less In Circuit Testing: High-speed Defect Detection and Reporting Full Access: Shorts – Opens tests, Component Measurement, Digital Device Test Limited Access: Boundary Scan, Powered Framescan, Opens Xpress, Framescan FX, Cluster test Test Coverage
Advantages
• Full Shorts Test Coverage
• Automated Test Generation
• Open Device Pins
• Higher Total Fault Coverage
• Analog Component Value and Tolerance
• Single Test Stage. Single Fixture and Operator
• Digital Component Functionality
• Highest Throughput to Meet Any Line Cycle Time
• Boundary Scan and Built-In Self Tests • Memory tests
Supported Test Technologies and Standards • 1149.1, 1149.6, 1149.8.1, Boundary Scan, Powered • Framescan, Opens Xpress, Framescan FX, Cluster test
Microcontroller Flashing: Full-Parallel In-System Programming Tester digital pins store all device programming in parallel without additional device High-speed digital applies programming vectors quickly. Advantages • High-speed from native in-system feature • Parallel programming for all panels on a PCB at a time • Third-party flash programming solutions supported
Pre-Screening Functional Test: Functional Verification with Analog, Digital Instruments Powered-up functional validation of key product features Support 3rd Party Instruments. Test Coverage • High Speed Digitizer / Digital Voltage Meter
• Time Measurement (frequency, interval, trigger and timers)
• Arbitrary Waveform Generator
• External Signal Multiplexer
• AC/DC Current Measurement
• High Voltage DC Power
• Mixed Signal Measurement Control
• Built-in Self Test Capability
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 3
Flexible System Architecture Core Hardware Subsystems • • • • • •
Digital Subsystem with per-Pin Logic Levels Analog Subsystem Integrated System Controller PXI Measurement System 3rd Party Functional Instrument Options User Instrument Expansions
Test Site Common Architecture Fixture Receiver
128 to 15,360 Hybrid Test Points Supported
ICA
MXII
System Controller
PC
Parallel Native Flash Option Boundary Scan Option Framescan, Powered Framescan Opens Xpress Time Measurement Option High-Speed Clock/Trigger Option Realtime Backdrive Monitor/Control DLL Control
Accessory Slot
• • • • • • • •
SFTM / DSM / HSC / CST
Common Options
Backward Compatibility Options • GR227X /TS8X /GR12X • Z1800, Spectrum, Others
# of Pincard Slots
Highly Scalable Pin Card Expansion Architecture “Scalable Platform Architecture for Any Product Mix or Any Volume”
30
TS (4,096) LX (7,680) LX2 (15,360)
LH LHS TSI 161 TSH
16
(4,096) (4,096) (6,400) (6,400)
10 TSO 51 TSI 51 TSH 51 TSH 161
5
1
TSO 52 TSI 52 TSA TSH 52
(2,560) (2,560) (2,560) (2,560)
2
(5,120–2,560/Site) (5,120–2,560/Site) (5,120–2,560/Site) (5,120–2,560/Site)
# of Independent Engines In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 4
Why Teradyne Wins Intelligent Test Optimization & Binary Execution Intelligent test optimization algorithms allocate system resources for the most efficient operation. Binary code implementation provides faster execution vs. interpreted code.
Incomparable Test Productivity
Advanced System Controller & Digital/Analog Subsystems Integrated system architecture delivers the most efficient test execution. Fully synchronous digital-analog subsystems for coherent mixed-mode testing.
Fully coherent mixed signal test for audio/signal processing applications.
Accuracy Matters in Analog and Digital Test
Analog True 6-wire guarded measurement delivers narrow test guard bands and low escape rate to next stage. Digital Per-pin driver/sensor with integrated overdrive protection supports any mix of logic families. 15mV absolute accuracy with 3mV programming resolution.
Highest Productivity for Any Mix, Any Volume Manual, robotic, and inline automation options. Multiple sites are independently configured.
True Parallel Testing with Teradyne Multi-Site
Automation Ready
Testing each boards on a panel simultaneously SITE 1
Synchronous & Asynchronous Options Support for single or multiple product tests in parallel.
SITE 2
Testing two different panels independently SITE 1
SITE 2
In-line Robot, Automation Integration Ready High speed In-line systems, RCI (Robot Communication Interface) development kit helps implement the cobot integration faster and easier. Highly portable tester inserts for 3rd party integrators. In-line Throughput Improvement Conventional ICT TestStation
Offline Throughput Improvement Conventional ICT
2.8X
Higher Throughput
TestStation
3.1X
Higher Throughput
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 5
Less is More
Save up to 6x Footprint vs. Competitors A single TestStation system can deliver the productivity of 3-6x competitive systems.
6X
=
5,040mm + α
4X
2,900mm + α
=
850mm
650mm
Native, Parallel In-System Programming High-speed digital applies vectors across N UUT in
Consolidating Multiple Production Stages
parallel. Third-party programming options are also supported. Functional Testing Power-up, self-test, and nominal operation test. Third-party functional test instrument expansion
ICT
Flash
FCT
for parametric specification testing.
Reliable Hardware & Easy Maintenance
OpEx & CapEx Friendly
Maintenance-friendly Design Service points easily accessible from front and rear. Robust modular design delivers low MTTR. Built for 24/7 Production Designed and built-to-last design for high productivity and high MTBF.
Streamline Manufacturing Costs Eliminate excess operators, fixtures, and energy costs. Common programming, fixturing, and debugging. Better space and workflow utilization. “Copy-exact” test results worldwide.
Final Test Final Test
Flash
Final Test Final Test
Flash
Final Test
Flash
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 6
System Software Solutions TestStation Software
Design-to-Build Software
TestStation Development Pro Software environment for developing high fault coverage in-circuit test programs TestStation Debug Pro User-friendly interface for debugging, developing, and qualifying in-circuit test programs TestStation Production Pro Teradyne’s simplified environment for performing production and system test
D2B Viewer D2B Viewer includes a powerful graphical viewer for displaying and navigating program resources. D2B Alchemist Efficient Test & Inspection Program Preparation and CAD Translation D2B ECO Quickly Identify PCBA Board Revision Differences
Optional Software Tools Test Quality Tools TestStation in-circuit test systems feature a Test Quality tool suite that consists of independent, but integrated functions to help manufacturers speed development of high quality in-circuit test programs. Functional Test Software Simplify Programming for External Communication. Create Dynamic Link Library Applications programs that link to AutoDebug Adjust Limits Analyze the TestStation Runtime system. This is the ideal interface for program control of PXI instruments in the TestStation Optimize Throughput Set Quality Criteria PXI Functional Application Board.
AutoDebug
Adjust Limits
Optimize Throughput
Analyze
Set Quality Criteria
TestStation Development Pro 8 & Windows 10 Support New System
Field Upgrade
All Models
TSH, TSHL, LH, LHS, LX, LX2, DUO, TSO, TSA, TSI, TSR
New TS Pro 8 & Windows 10 Support Applicable Models Requirement
Compatible Teradyne PC In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 7
TestStation Pro Software Teradyne’s TestStation Pro Software is available for all UltraPin based TestStation in-circuit test systems. This TestStation Pro Software provides three powerful user environments for development, debug, and production.
Development Pro
Production Pro
Debug Pro
What’s New on TestStation Pro Software 8.0 (Release in January 2020)
Easier Program with Navigation Tree The new navigation tree lets you asses at a glance the steps you’ve taken in developing the test program and the status of the steps you’ve completed. Each step can be expanded and collapsed to give you an overall view of the program’s development and status.
Consolidated Data Management: All-new DataStore Editor New Datastore Editor encompassing the Product, Fixture, and Power Editors to all you to perform all product and fixture data work in one place.
Developer-friendly Program Editing: All-new Built-in Editor The Built-in Editor displays as a tab in the workspace area of the window with the line containing the error highlighted for you to correct. This eliminates the need to leave TS Development Pro, enter a text editor, correct an error, and come back to TS Development Pro.
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 8
Smart Factory Solution
Smart4Metrics(S4M) is a comprehensive smart factory software solution that helps customers monitor test and production in real-time as a sensor for quality measurement. S4M also provides development environment to exchange test data with other systems or ecosystems more efficiently and quickly.
Production Pro
Development Pro
Any Standards
Any Systems
Any Devices
Values for Customers • Provide Robust Real-time Product + Tester Data • Ecosystem Friendly Development Environment • Lowest Cost of Investment & Ownership
Peer Systems
MES Systems
Smart Factory Standard / Protocols Open API
i4.0 Interface
DBMS (Open Source)
Real-time Dashboards
Real-time System Hardware Monitoring
Real-time Production Summary Dashboard
Real-time Maintenance Dashboard
Production Timeline Dashboard
Smart4Metrics Vision Board Production
Test Measurement Analysis
Yield Improvement
Predictive Maintenance & Optimization
Yield
Yield
Test Measurement
Target Yield Intelligent Diagnostic
Time
Time
Testing Process • Gatekeep manufacturing defects • Preventive maintenance • Supplier management with data
• Retrieve Insight for process optimization • Sustain production uptime • Reduce operation cost
Smart Factory Ecosystems • Provide reliable test measurement data for process optimization • Quick and easy data exchange interface development • Contribute to smart factory ecosystem for smart factory realization
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 9
Smart4Metrics Dashboard
Real-time Production Summary Dashboard Shows the Key Performance Indicators (KPI) for the tester. OEE (Overall Equipment Effectiveness) is a measure of the tester’s productivity. OEE is calculated by multiplying the three factors: Availability, Performance and Quality.
Real-time Maintenance Dashboard Display the current maintenance status of the tester with reminders of when items are due. The user may have the system generate custom alerts as the due dates approach or are exceeded.
Production Timeline Dashboard Shows the OEE of the tester over the course of a selected time period. It allows the user to select the length of time that they wish to see as well such as last day, week, month, etc.
Real-time System Monitoring Dashboard Shows data from sensors located in critical components in the tester. The data is displayed via run charts and graphs over various timelines. The user may have the system generate custom alerts when threshold levels are exceeded.
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 10
Standard Test Capabilities Analog Test • Component Measurement Capability • Resistive (R) Range: 0.1 to 30Mohm • Capacitive (C) Range: 1pF to 10,000çF • Inductive (L) Range: 10çH to 1,000H • Measurement Matrix: 8 channels scannable to any pin • 2 Sources, configurable as current or voltage • DC Voltage Source: programmable , 16-bit, 0 to ±18V over 4 ranges, to ±500mA, programmable current limiting • DC Current Source: programmable, 16-bit, 0 to ±500mA over 8 ranges, to ±18V, programmable voltage limiting • DC Voltmeter: 0 to ±200V over 9 ranges • DC Ammeter: 0 to ±160mA over 7 ranges • High Voltage Source configurable as current or voltage, programmable voltage limit, ±120V, ±50mA • Reactance Module: • Programmable frequency from 15Hz to 100kHz • Programmable AC level to 7Vrms, 12-bit • Programmable DC offset, 16-bit • Arbitrary Waveform Generator
• • • •
True RMS-DC Detection Differential Detector/DVM/Digitizer Coherent Transfer Function Measurement External Instrument Matrix: 9 BNCs to 8 line to internal instruments or n pins • Traceable Calibration Daughterboard • IEEE-488 Interface Controller
Digital Test • • • • • • • • • •
Teradyne Custom UltraPin Driver/Sensors Closed Loop, Low Impedance Pin, Less than 0.6ohm 15mV Driver/Sensor Accuracy Real-Time Current Measurement Automatic Driver Verification 26 programmable logic levels from + 5.5V to - 2.5V Dual Level Thresholds, independent for D and S Programmable Backdrive Controls Clock Drive and Trigger Pins to 20MHz 64K memory behind each Driver/Sensor pin
System Application Highlights In-line Systems Model
TSH
TSH Large Format
TSI 51
Up to 2,560 Test Nodes (5 Pin Boards)
TSI 52
Up to 5,120 Test Nodes (2,560/Site, 5 Pin Boards/Site)
TSI 161
N/A
Up to 6,400 Test Nodes (16 Pin Boards)
Press Pressure Force
Up to 15kN
Up to 18kN
Max. UUT Size
450mm x 350mm
530mm x 508mm
Max. PCB Weight
3kg
5kg
Top Side Clearance
100mm
100mm
Bottom Side Clearance
30mm
30mm
Dimension (WxHxD, mm)
850 x 2121 x 1100
850 x 2121 x 1262
Inserts
In-Circuit Board Test Solutions Any Mix, Any Volume PCBA Production 11
Offline Systems Category
Large Frame
Model
Extra Large Frame
LHS
LH
TSO
TSA
LX
LX2
Single
Single
Single or Dual
Dual (Asynchronous)
Single
Single
16
16
2x5
2x5
30
30
4,096
4,096
5,120 or 2,560/Site
5,120 (2,560/Site)
7,680
15,360
840 x 754 x 1349
1102 x 832 x 878
1672 x 844 x 1130
1672 x 844 x 1130
Test Site Pin Card Slots Max. Test Points Dimension (WxHxD, mm)
Dual Site Frame
600 x 1560 x 1980 600 x 1560 x 1980
Tester Inserts for 3rd Party Automation Integrators Model Test Site
Max. Test Points No. of Pin Board Slot
TSI 51
TSI 52
TSI 161
Single Site
Dual Site
Single Site
2,560
5,120 (2560 per Site)
6,400
5
10 (5 per Site)
16
For more information, contact your Teradyne representative or visit us at www.teradyne.com/pbt
Teradyne and the Teradyne logo are trademarks of Teradyne, Inc. All other brand and product names are trademarks or registered trademarks of their respective owners. Information contained in this document is summary in nature and subject to change without notice. © Teradyne 2020. All rights reserved. PBT-OV-012020