Future Metrology Hub Research Road Map

The Future Metrology Hub An EPSRC Manufacturing Research Hub

EPSRC Future Metrology Hub UK Metrology Research Roadmap

Contents

EPSRC Future Metrology Hub Roadmap

Section 1 Introduction 3 Section 2 Landscape 4 Trends and Drivers

5

Research Themes

6

Capabilities and Enablers

7

Linkage Chart

8

Section 3 Key Themes

9

Metrology as an enabling technology

9

Novel technologies or approaches necessary to create the next generation of sensors/systems

10

Metrology as a fundamental aspect of simulation, and by extension the design process

11

Metrology as a key component of sustainable manufacture

12

Growing metrology skills gap

13

Section 4 Conclusions

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Appendix 16

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SECTION 1

EPSRC Future Metrology Hub Roadmap

Welcome and Introduction Welcome to the Future Metrology Hub Research Roadmap report.

The Future Metrology Hub is a 7 year EPSRC funded programme which brings together experts in the fields of sensor development, data analytics, embedded metrology and metrology techniques and applications.

The Hub is based within the Centre for Precision Technologies at the University of Huddersfield with research spokes at the Universities of Bath, Loughborough and Sheffield. In addition to the core consortium, the Hub is supported by a wide range of partners from across academia and industry.

This report has been created to detail the key findings from our first roadmapping event which took place in early 2020. The event was facilitated by the Institute for Manufacturing, based at the University of Cambridge, and held over a full day at Loughborough University. Taking part were delegates from across the Hub consortium along with representatives from the HVM Catapult Centres, other Manufacturing Hubs, the National Physical Laboratory (NPL) and from across the UK Academic community. In total, 20 external organisations were represented. External delegates were invited based on their specialist knowledge or experience working in metrology research or in a related manufacturing field with unique metrology challenges.

Much work has taken place recently around developing roadmaps for metrology, especially in the fields of advanced manufacturing and industry. The High Value Manufacturing Catapult (HVMC) Centres are currently working on a roadmap for UK manufacturing1 while a recent report2 published by HVMC investigated a systematic approach to integrated measurement and control for advanced manufacturing over a 10 year period. These exercises have generally covered the whole spectrum of metrology but have focussed on identifying the key challenges facing industry and the associated metrology applications and techniques which can be used to address them.

To build on the existing body of work, the Hub decided to focus our roadmapping event very specifically on the research landscape to determine the best ways in which the research community, comprising Academia, Industrial R&D and Policymakers/Funding Bodies, could meet the needs that have been previously identified. In preparation for the event, we worked closely with the HVM Catapult team to examine their highly detailed roadmap and used our Industrial Metrology Forum to determine the highest priority topics which we could include for discussion.

I would like to take this opportunity to thank the teams at the HVM Catapult Centres, the Institute for Manufacturing and all the participants who attended the event. The activities and discussion on the day were immensely helpful in developing the Hub’s ongoing strategy and helping initiate a national strategy for metrology research. I also hope the external delegates found the event interesting and that the new relationships and ideas for collaboration that were discussed bear fruit.

We hope that you find this report informative and useful in formulating your future plans and that you will continue to engage with the Future Metrology Hub over the coming years.

Professor Dame Xianqian (Jane) Jiang

Simon Cavill, Metrology Technical Lead, Nuclear AMRC, Project Lead for Metrology Roadmap Richard Leach, Integrated Metrology: 10-year Roadmap for Advanced Manufacturing (High Value Manufacturing Catapult, 2020)

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2

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SECTION 2

EPSRC Future Metrology Hub Roadmap

Landscape The initial draft landscape consisted of approximately 120 items which were derived from the highly detailed HVM Catapult Roadmap and the outputs of the 2019 Industrial Metrology Forum.

The landscape on its own is relatively limited and is only really suitable in identifying priority items.

To enable a more strategic approach to planning, to determine a route to an end goal, a linkage chart is provided which shows the interdependencies and relationships between the three areas.

These individual topics were then separated into three areas: Trends & Drivers, Research Themes and Capabilities & Enablers. The list was further expanded at the event to include inputs from the delegates and in total approximately 150 items were available for consideration. The full list of discussion items is provided in Appendix A. Items were further subdivided into three timescales: Short Term (1-2 years), Medium Term (3-5 years) and Long Term (5-10 years). It should be noted that items were placed in the timescale where they would be most prominent. It does not imply that activities are limited solely to this window.

Linkage Chart

In order to refine the landscape into a more manageable size, each area was discussed both in small groups and as a whole before delegates were asked to cast their votes for the most important items. Each delegate was allowed a limited number of votes, forcing them to prioritise. The tables shown over the next three pages illustrate the final prioritised landscape. Icons have been added to the Trend & Drivers and Capabilities & Enablers table to indicate the audience these items are most relevant to.

Figure 1 (below) shows the method used to interpret the Linkage Chart. The heatmap shows the links that delegates identified between areas and the strength of the relationship is a reflection of the number of delegates who identified the link. The chart can be used to identify the direct links between areas in order to make plans to address a specific need. The chart can also be used to evaluate the strategic importance of any element by considering the columns and rows as a whole. For example, considering the ‘World Class Optical Sensor Research Base’ we can see that this is linked to 13 research topics with very strong links to at least 5. This indicates that putting effort into building and developing this capability has wide ranging potential and could yield significant impact across multiple areas.

Figure 1: Linkage chart process

Open access materials database

AI and autonomous technology

Digital platform for digital twin

Real-time metrology

HPC systems

Real time error compensation during manufacturing

Software tool to predict errors prior to manufacturing

Optical compressed sensing techniques as alternative to big data

High speed secure and robust communications networks (e.g. 5G)

Infrastructure technology for AM GDT, design manufacture, metrology

Industrial partnerships and industry engagement

Engagement with ISO (and other national/international organisations)

Rapid 3D surface mapping for comparison and micron nano level

World class data science research base

End users working with metrology institutes

Technology developers working with metrology institutes

National and/or regional metrology centres

World class optical sensor research base

Modelling & Simulation (e.g. Digital Twin)

Tracability

Automation, metrology system for assisted machining and assembly

ology, Sensornets

including international standards

Smart products processes and big data and analytics

Understanding and improving tolerancing

Impact of Brexit on international cooperation (e.g. creation of standards)

Embedded Sensors

XCT

increased automation for global competitiveness

In process measurement

Reduced waste and scrappage

Non contact measurement of light absorbing materials e.g. carbo

Portable metrology

Error Mapping and compensation

Optical Technology

Research Themes

Volumetric NDT scanning technologies and calibration

Capabilities and Enablers

Trends and Drivers

Automatic defect recognition New sensor technology (eg miniaturisation, low cost etc) Process monitoring In-process metrology system integration and calibration Miniaturisation of devices Portable metrology systems (in situ) Measurement system integration to machine In-process measurement of surface etc Real time systems Sensor integration into manufacturing processes Adaptive control AI Closed loop control from process inspection True digital twin AND Virtual manufacturing and metrology system Meta-materials measurement and photonic integration

Heatmap Trends and Drivers push research themes

Shows the relationship between factors and the weighting they were given by participants. Can be used to identify high priority research areas and the most crucial capabilities that must be developed

Capabilities and Enablers facilitate the research

4

SECTION 2: Landscape

EPSRC Future Metrology Hub Roadmap

5

Trends & drivers Table 1 shows the priority trends and drivers. These are the driving goals for the development or refinement of new and existing technologies. In terms of a roadmap, these represent the destination that must be reached.

Icon key Policymakers

Industry

Academia

Table 1: Trends & Drivers Short term (1-2 years) Trends & drivers Global and national trends & drivers

Industry trends & drivers

Industry needs

Medium term (3-5 years)

Long term (5-10 years)

Reference code Social, technical, political, environmental, TD1 economic, legal (including sustainability)

Reduced waste and scrappage

Other (standards, traceability, etc.)

TD2

Including market, technology and business trends and drivers, product and service programmes (including industrial strategy)

TD3

Understanding and improving

tolerancing

TD3

Traceability

In-process metrology

TD4

Digital metrology

TD5

Metrology for non-controlled environments

Portable metrology In process measurement

Reduced lead times and costs, faster more efficient manufacturing processes Embedded sensors Smart product processes and big

data and analytics

TD6 Sensornets

Metrology for additive manufacture

TD7

Metrology for composites

TD8

Other

TD9

Non contact measurement of light absorbing materials e.g. carbon fibre

New science

Quantum, photonics, etc.

TD10

Increased automation for global competitiveness

Fundraising and REF scores

e.g. UKRI, industry and funding agency

TD11

Competitors

TD12

UK

TD13

Automation, metrology system for assisted machining and assembly

National strategy Global and national

Hub strategy

TD14

Other

TD15

Optical technology Error mapping and compensation

of multi cooperating platforms

XCT

Modelling & simulation (e.g. digital twin) Machine learning & AI (inc. category semantic language

SECTION 2: Landscape

EPSRC Future Metrology Hub Roadmap

Research Themes Table 2 shows the prioritised research themes. These represent the highest value avenues for research activities and are analogous to the route that must be taken to reach the destination.

Table 2: Research Themes Short term (1-2 years)

Medium term (3-5 years)

Long term (5-10 years)

Reference code

Research Themes

Product technology,. i.e. related to delivery of product functionalities

RT1

New Sensor Technology (e.g. Miniaturisation, Low Cost, Uncontrolled Environments, Challenging Materials) Miniaturisation of devises

Technology

Materials technology, e.g. Nano materials, Hybrid materials

RT2

Enabling technology e.g. testing, ICT, modelling/simulation, Software Other

RT3

Meta-materials measurement and photonic integration Portable metrology systems (in-situ analysis)

Adaptive control Artificial intelligence RT4 In-process metrology system integration and calibration

Production process technologies

Real Time Systems (Measurement, Uncertainty, Analytics)

RT5

Process monitoring

In-process measurement of surface/ subsurface geometry and other characteristics

Automatic defect recognition (NDT) Manufacturing

Design for Verification

RT6

System engineering/integration competencies

RT7

True digital twin Measurement system integration to machine (accuracy vs machine and in-process environment)

Management/operational competences RT8 Other Supply Chain and value chain Integrated systems Skills Other

e.g. Integration along networks of suppliers across the product life cycle e.g. Combinations of technologies which create end effects e.g. training, academia-industry engagement

RT9 RT10 RT11 RT12 RT13

Skills and proficiency standard for metrology

Sensor integration into manufacturing process

Closed loop control from process inspection

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SECTION 2: Landscape

EPSRC Future Metrology Hub Roadmap

Capabilities & Enablers Table 3 shows the prioritised capabilities and enablers. These are the most valuable resources and connections that can be drawn upon to facilitate research and may be considered the tools that make the journey possible.

Icon key Policymakers

Industry

Academia

Table 3: Capabilities & Enablers Short term (1-2 years) Capabilities & Enablers

XCT scanning technologies

and calibration Skills

Government and processes

Medium term (3-5 years)

Rapid 3D surface mapping for

comparison at micron scale

Real time error

compensation during manufacturing

oftware tool to predict errors S prior to manufacturing

Real time metrology

CE1

CE2 Infrastructure technology for AM

GDT, design manufacture, metrology

Research capability

Community education

measurement/metrology Infrastructure (e.g Asset/facility requirements, etc.)

CE3

Acoustic NDT H igh speed secure and robust communications networks (e.g. 5G) AI and autonomous technology N ational and/or regional metrology centre (e.g. Hub, NPL, Metrology Institutes, HVM Captapults)

Metrology Community

Current Hub Consortium (Hub/Spokes, Feasibility Partners, CE4 NPL, HVM Catapult, Industry R&D) including international collaboration

class optical sensor World

research base Technology developers working with metrology institutes users working with End

metrology institutes class data science World

research base

Key performance indicators Policy Other

Wider Metrology Community (New relationships required to enhance research and delivery Targets and measurement for research and development Recommend changes to national policy, standards, incentives etc.

Long term (5-10 years)

Reference code

CE5

partnerships and Industrial

industry engagement

CE6 CE7 CE8

ngagement with ISO (and other E national/international organisations)

7

ology,

Modelling & Simulation (e.g. Digital Twin)

Tracability Automatic defect recognition New sensor technology (eg miniaturisation, low cost etc) Process monitoring In-process metrology system integration and calibration Miniaturisation of devices Portable metrology systems (in situ) Measurement system integration to machine In-process measurement of surface etc.

Real time systems Sensor integration into manufacturing processes Adaptive control AI Closed loop control from process inspection True digital twin AND Virtual manufacturing and metrology system

Research Themes

Meta-materials measurement and photonic integration

EPSRC Future Metrology Hub Roadmap

Open access materials database

AI and autonomous technology

Digital platform for digital twin

Real-time metrology

HPC systems

Real time error compensation during manufacturing

Optical compressed sensing techniques as alternative to big data

High speed secure and robust communications networks (e.g. 5G)

Software tool to predict errors prior to manufacturing

Infrastructure technology for AM GDT, design manufacture, metrology

Rapid 3D surface mapping for comparison and micron nano level

Engagement with ISO (and other national/international organisations)

Industrial partnerships and industry engagement

World class data science research base

End users working with metrology institutes

Technology developers working with metrology institutes

Volumetric NDT scanning technologies and calibration

World class optical sensor research base

Trends and Drivers

National and/or regional metrology centres

processes

Automation, metrology system for assisted machining and assembly

Sensornets

including international standards

Understanding and improving tolerancing

Smart products processes and big data and analytics

XCT

Impact of Brexit on international cooperation (e.g. creation of standards)

Embedded Sensors

Increased automation for global competitiveness

In process measurement

Reduced waste and scrappage

Non contact measurement of light absorbing materials e.g. carbo

Portable metrology

Error Mapping and compensation

Optical Technology

SECTION 2: Landscape 8

Linkage Chart Figure 2 shows the linkages chart which represents the connections between the Trends & Drivers, Research Themes and Capabilities & Enablers

Figure 2: Linkage chart

Capabilities and Enablers

SECTION 3

EPSRC Future Metrology Hub Roadmap

Key Themes Over the course of the roadmapping event, several key themes emerged which encapsulated multiple topics and covered broadly similar ideas across the prioritised research landscape. These key themes are outlined below along with key messages linked to particular demographics. To enable easier comparison, the landscape areas for each theme have also been identified.

This section aims to provide an overview of the discussions which took place at the event and these key themes collect together related topics which may form the basis for high level strategic plans. However, you may find that some aspects are more relevant to your individual areas of concern than others and these themes are not exhaustive. Many of the landscape topics which were not prioritised would also fit within these key themes and could form the basis for ideas for further development.

Metrology as an enabling technology

Trends & Drivers

Research Themes

Capabilities & Enablers

TD4

RT3

CE3

TD9

RT5

CE4

TD10

This approach is also only well suited to measurement by sampling for anything other than very low volume production.

True in-process/embedded metrology systems would significantly improve productivity by eliminating the time taken moving between manufacturing and measurement functions while also allowing for continuous measurement throughout all manufacturing stages, leading to reduced re-work, redundant processing and scrappage. In this way, advanced metrology is crucial in facilitating autonomous manufacture by allowing the development of smart systems capable of real time decision making for process control.

New production technologies and processes spreading due to the influence of Industry 4.0, inevitably bring with them new metrology challenges. It is also the case that these measurement techniques may have additional applications outside the fields of traditional manufacturing.

For example, technologies developed for autonomous defect detection on large volume parts have been adapted for use on autonomous vehicles. Without the coordinated activities of industry and academia and the accompanying investment, it is likely progress in several sectors will be substantially delayed.

CE5

TD15 Metrology has long been recognised as an enabling technology for engineering innovation. Previously, improvements in metrology technology have focussed on increasing measurement accuracy and resolution which can be achieved, this has allowed manufacture of items to ever increasing degrees of precision.

However, the impact of advanced measurement capability is rarely obvious or fully understood to those outside the metrology community.

Currently, significant interest is being paid to the potential for metrology to drive productivity improvements. As an end of line process, conventional metrology carried out as a Quality Assurance (QA) activity, increases production times while also significantly increasing cost.

Key message Metrology is a crucial element of all scientific, manufacturing and industrial processes.

Breakthroughs in these areas are often closely related to developments in metrology technology and techniques though the role of metrology is often significantly less visible.

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SECTION 3

EPSRC Future Metrology Hub Roadmap

Key Themes Novel technologies or approaches necessary to create the next generation of sensors/systems

Trends & Drivers

Research Themes

Capabilities & Enablers

TD5

RT1

CE1

TD6

RT2

CE3

TD15

RT3

CE4

RT4

CE5

RT7 Factors such as accuracy and precisions are of course still of primary importance to industrial metrology. However, as industry moves more towards fully autonomous manufacture and servitisation as a business model, integrated metrology solutions are increasingly in demand to meet these new challenges.

In order to adapt existing technologies to be suitable for in-process measurement, it is necessary to both miniaturise and enhance the ruggedness of sensors to be capable of operating within the manufacturing environment while minimising the impact on production capability. Optical measurement techniques are well suited to a wide variety of operating environments and are capable of achieving the speed and precision of measurement necessary. Ideally, to avoid disruption to the manufacturing process, methods for in-situ traceable self-calibration must be developed which require minimal user input or be capable of being completed automatically. There are limits to what can be achieved through the use of conventional sensors or measurement devices and new approaches which make use of novel technologies will be necessary to overcome fundamental physical barriers. These novel approaches may draw on technologies in other fields, such as semi-conductor manufacturing techniques to develop “on-a-chip” optical systems or making use of the unique optical properties of metamaterials to enable photonic integration.

In addition to the physical challenges of developing sensors which can be incorporated into manufacturing processes, the trend towards continuous monitoring generates substantially greater quantities

of data. New approaches to how this data is handled, curated and processed will need to be developed to create software capable of dealing with vast quantities of synchronous data autonomously to produce an accessible and useable output. Achieving this will require expertise from a variety of disciplines such as mathematics, data science and cyber security.

Ultimately, the aim is to use metrology driven data to autonomously monitor and control manufacturing processes in real time. Even with advanced software, the challenge of monitoring all but the most basic manufacturing environment is beyond even highly skilled operatives. Artificial Intelligence (AI) and machine learning show the greatest potential to maximise the value of this data however there are significant challenges which must be overcome before AI can be a viable, widespread solution.

Autonomous systems must be capable of dealing with uncertainty in the measured data and using it to make robust, traceable, informed decisions.

Key message Industry can often be reluctant to move away from established technology and tends to “stick with what they know”. Meanwhile, translating novel approaches to metrology from lab based experiments into industry ready solutions is often as challenging as the fundamental science. Building strong links with academia should enable much more rapid access to cutting edge technology and yield a competitive advantage.

Key message The field of metrology offers a wealth of opportunities to deploy novel science or technology into real world applications.

Researchers in metrology should stay abreast of developments in scientific fields and actively recruit researchers from a diverse range of subjects by maintaining a broad network of connections.

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SECTION 3

EPSRC Future Metrology Hub Roadmap

Key Themes Metrology as a fundamental aspect of simulation, and by extension the design process

Trends & Drivers

Research Themes

Capabilities & Enablers

TD3

RT3

CE1

TD6

RT5

CE3

TD10

RT7

CE4

TD15

RT11

CE5

Modelling and simulation are established engineering techniques and are often used as part of the design process to evaluate the function and performance of engineering designs. By using known variables such as the geometry of a part, the material qualities, operational environment and loading conditions, it is possible to simulate a part and predict with significant accuracy, how the part will behave in service. The same ideas can be applied to manufacturing processes to simulate the tool workpiece interaction and predict the impact on the finished part. However, quantifying all variables in the manufacturing environment presents a substantial challenge.

Metrology is a key element in overcoming these challenges. However, it not just the case that the manufacturing variables must be measured once and then used in isolation as values in a calculation.

A historic database of previously measured data can be used to develop a model, but variables change in real time. Closed loop control requires a process to be continually monitored, with an estimate of the data uncertainty, to account for the dynamic situation.

A holistic approach to manufacture which integrates metrology into all stages of design, production and evaluation must become the norm. Consequently, advances will come in stages with the development of true digital twins being a long term goal. Generating this data can present a significant barrier at the research stage. Companies can often be reluctant to share process data and performance results due to commercial sensitivities. Crucial to overcoming this barrier is the formation of strong partnerships between academia and industry. Research teams must be supported by competent and sympathetic business engagement teams who can help guide the process and develop robust contractual agreements which build confidence.

The ability to simulate manufacturing processes presents opportunities across many fields but it will be fundamental in facilitating agile manufacture, optimally choosing the right machine and process within a set of given performance constraints. This is especially attractive to companies engaged in the low volume/one off manufacture of extremely high value components. In these scenarios, there is little opportunity to observe the manufacturing process and make incremental improvements; there is a need to get it ‘right first time’. In these situations, any time saved in the design, machine set up and machining stages can represent significant productivity gains with waste, cost and lead times all reduced. Companies engaged in low volume/high value manufacture are often tier 1 and 2 suppliers to high value industries such as aerospace and defence. The ability to pass these cost savings up through the supply chain may provide a significant competitive advantage when attracting new business.

Key message The ability to accurately simulate and predict the outcome of machine/ workpiece interactions presents a substantial opportunity for manufacturers.

Embracing this technology will enable more efficient, agile manufacture to reduce waste, cost and lead times.

Key message Developing true digital twin systems presents a significant challenge due to the vast number of processes, materials and environmental conditions which must be understood. Crucial to achieving this is the ability to gather real world data from a broad range of manufacturing environments. Universities must build strong partnerships with industry where both parties have a willingness to share data and have close interaction if this is to be possible.

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SECTION 3

EPSRC Future Metrology Hub Roadmap

12

Key Themes Metrology as a key component of sustainable manufacture

Trends & Drivers

Research Themes

TD1

RT5

TD4

Capabilities & Enablers CE3 CE4 CE5 CE7

Sustainable manufacture is a topic of great interest to society, while climate change and the green revolution will continue to have a pre-eminent place in the public conscious. Great attention is being paid to how energy is generated and used. Metrology has significant direct and indirect roles to play in reducing energy usage in the manufacturing sector.

As with all technological improvement, there is an initial trade off to be made. Developing integrated metrology systems for an established manufacturing environment requires significant investment by industry in terms of capital outlay and upskilling of the workforce. However, the increased productivity and reduced lead times can offset this to manufacturers and yield a substantial return. Large companies who already enjoy strong relationships with universities and the metrology community through industrial R&D programmes are well placed to take advantage of this technology as ‘early adopters’ however, the benefits are potentially even more relevant for small to medium size companies which engage in the manufacture of high value components at very low volumes. These smaller companies often do not have access to the resources necessary to run an R&D programme.

Access to innovation grants administered either directly through funding bodies such as Innovate UK or indirectly through academic institutions is crucial to overcoming this barrier to participation.

The energy efficiency of any manufacturing process is directly linked to the operating efficiency of that process. If a process can be completed more quickly or with fewer stages, less energy will be used overall.

The ability to accurately model and simulate manufacturing processes at the design stage, through a true digital twin, would allow a process to be optimised in advance of machining, without having to go through a trial and error approach.

This is especially important for low volume manufacture of high value parts where production run times are long per part but are too short for empirical data to be generated for a number of similar parts.

The ability to autonomously control manufacturing in real time, as a result of in-process measurement, offers the potential for further efficiency gains as processes can be kept in their optimum range throughout changing manufacturing conditions.

The direct efficiency benefits are obvious. However, there are also substantial indirect benefits. By reducing the need for rework or corrective machining, energy use is further reduced. Meanwhile, material waste is reduced through optimised stock removal and fewer scrap parts. This yields a downstream benefit in the form of reduced embedded emissions as a result of raw material manufacture and transport.

Key message An increased ability to quantify and evaluate various aspects of the manufacturing process can help companies achieve significant gains in efficiency.

However, developing and adopting new metrology technologies and techniques is capital intensive and few companies have access to world leading knowledge and expertise in the field.

SECTION 3

EPSRC Future Metrology Hub Roadmap

Key Themes Growing metrology skills gap

Trends & Drivers

Research Themes

TD13

RT12

TD14

Capabilities & Enablers CE3 CE4 CE5 CE7

For the most part, engineers and workers are unfamiliar with all but the most basic principles of good metrology practice and knowledge of concepts such as repeatability, traceability and uncertainty are limited to metrology specialists. This approach is effective only when measurement takes place as a separate, end of process activity. As in-process systems become more common place and continuous monitoring rather than sampling becomes the norm, design, manufacturing and production engineers will need a strong understanding of metrology theory in order to understand the new concepts of optimising their manufacturing processes.

Metrology as a subject is rarely taught as part of undergraduate engineering courses. For most engineers, this means that the first time they encounter anything more than basic measurement, is when a serious challenge presents itself, meaning that metrology training is treated almost like vocational education. Furthermore, the lack of a well-developed and recognised framework for metrology training prevents academia and industry from developing a coordinated and standardised approach to developing a skilled workforce.

This lack of knowledge and experience in early career hinders those with aptitude and talent for metrology from identifying it as a potential career choice. In this way, the future rising stars of metrology are only identified after they have entered and become established in the profession, this may lead the metrology community to miss out on a great deal of young talent.

Due to the reasons stated, recruiting qualified candidates into roles with a strong metrology focus is well known to be a challenge. This problem affects both industry and academia and is likely to become increasingly difficult if current trends continue. It is difficult to estimate the cost to the UK economy of this growing skills gap. As an enabling technology, the direct value of metrology systems and technology is small when compared to the value of the potential breakthroughs and improvements in manufacturing capability and productivity which these technologies may bring.

Further research into the total value of metrology to the UK economy may prove crucial to raising its profile.

Key message The previous model of having a select few individuals, typically a QA department, trained in good metrology theory and practice will no longer be efficient or effective as in-process systems become more widespread. Knowledge and understanding of metrology will need to be a core element of a production/manufacturing engineer’s training.

Key message Training in good metrology practice is uncommon for undergraduate students.

Typically, students and researchers are only trained in metrology when they encounter a specific issue. By incorporating metrology more broadly into the syllabus, graduates will gain a highly valuable skill and the pool of talent which the metrology community can draw upon to find talented researchers will be expanded.

Key message The true impact of the skills gap is not fully understood and could be significantly hampering the growth of high value manufacturing capacity in the UK. Meanwhile, the lack of a recognised framework for metrology training hampers both academia and industry in developing a strategic approach to addressing the skills gap.

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SECTION 4

EPSRC Future Metrology Hub Roadmap

Conclusions At the start of the roadmapping event, delegates were presented with approximately 120 items, derived from the original HVM Catapult roadmap, for discussion which were separated into the three landscape areas.

These lists were further expanded as delegates added items they thought had been overlooked.

In total, approximately 150 items were available for consideration, which encompasses most, if not all, of metrology for manufacture. Such an expansive list is useful when trying to look at the big picture but it is less useful for strategic decision making.

From the outset, the primary objective of the roadmapping event was to provide a degree of prioritisation to identify the most strategically valuable areas for the metrology community to focus its efforts.

The final activity of the roadmapping event involved small groups working on project plans to address the prioritised research themes. The detailed project plans will not be given in this report to allow the project teams the opportunity to progress their ideas further, however, a list of these projects is shown in Table 4.

The project plans were made available at the end of the session for other delegates to examine, provide comment and rate for opportunity and feasibility.

The average score that each project received for Feasibility vs Opportunity are shown in Figure 3.

As these projects were generated from an already refined list of high priority topics, it is natural that they all scored relatively high in both criteria.

However, it is notable that there is a reasonable spread of averages and that within those, the extreme spread of scores varied substantially.

The landscape and key themes which have emerged have achieved this goal and give a strong indication of which needs are the most important to fill, what research is necessary to meet those needs and what resources are required to support that research.

It is important to remember that this landscape is prioritised based on the sector as a whole. If an item does not appear on the landscape, that does not imply that it is unimportant. To an individual facing a specific challenge, it may be crucial. Only a third of topics made it to the final landscape. This is useful when carrying out strategic planning activities such as resource allocation but may not fully meet the very specific needs of an individual organisation. Many of the items which do not appear on the final landscape are closely related to others that do. Similarly, most of these topics would sit comfortably within the key themes identified.

Table 4: Project Titles Key Theme

Project

Title

Enabling Technology

13

Portable metrology systems

Enabling Technology

4

High value component machining controller

Enabling Technology

5&6

Sensor integration to facilitate process monitoring

Enabling Technology

7

Intelligent data analysis and decision making and closed loop control

Novel Technologies

1

In-process metrology system integration and calibration

Novel Technologies

2

New sensor technology

Novel Technologies

3

In-process measurement of surfaces

Novel Technologies

8

Measurement system integration to machine

Novel Technologies

10

Automated defect recognition

Novel Technologies

11

Adaptive control/AI

Novel Technologies

12

Miniaturisation of metrology devices

Novel Technologies

15

Meta-materials measurement and photonic integration

Simulation & Modelling

9

Digital twin

Skills Gap

14

Skills and proficiency standards for metrology

14

SECTION 4

EPSRC Future Metrology Hub Roadmap

Conclusions Figure 3: Feasibility vs Opportunity

12 2

9

4 8

13

Opportunity

9

5+6

10

11

15

7

12

3

1

14

6

3

0

0

3

6

9

12

Feasibility

The Future Metrology Hub will be incorporating the findings from the event into its strategic plans both for the Hub consortium and for the individual organisations when considering future projects.

However, the breadth of topics is beyond the scope of the Hub acting on its own. Areas in the landscape that are outside of the Hub’s core research themes or beyond the existing skill set within the consortium will form the basis for future Feasibility Calls aimed at addressing specific areas and drawing on the expertise from a variety of disciplines. The Hub will also continue to grow its network of partner organisations and is always keen to engage with other academics or industrialists with metrology challenges.

We hope that this report has highlighted the crucial role metrology has to play as an underpinning technology and its importance to the UK’s manufacturing capability. Beyond the Hub, we hope that this will serve as a call to action for other research groups, industrialists and policymakers to review and adapt their future plans to address the strategic challenges that have been identified. To be fully effective, the metrology community should continue to develop a more collaborative approach and engage with organisations such as the Future Metrology Hub or the HVM Catapult network to ensure they remain informed and up to date with the most recent developments in an ever evolving field.

The Hub team would like to once again thank the teams at the HVM Catapults, the Institute for Manufacturing and all the participants for their support.

The Hub also gratefully acknowledges the support of the Engineering and Physical Sciences Research Council (EPSRC) in funding the Future Metrology Hub (Grant ref:EP/P006930/1)

The Future Metrology Hub An EPSRC Manufacturing Research Hub

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Appendix 1

EPSRC Future Metrology Hub Roadmap

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Full landscape options/discussion topics list The following table lists all the options available for discussion or voting at the roadmapping event. They were generated in advance from the HVM Catapult Industrial Metrology Roadmap, ideas suggested at the Future Metrology Hub’s 2019 Industrial Metrology Forum or added on the day by participants at the roadmapping event.

Trends & drivers Additive/Hybrid manufacturing (including fast, complex parts, safety critical applications Automated self fabrication Automation, metrology system for assisted machining and assembly Autonomous Manufacturing Carbon neutral sustainable manufacturing Data analysis supporting systems Data Analytics Data security, ownership in remote diagnostics Data visualisation using augmented reality Design for Verification Development of metrology apprentice programme - lack of skills Embedded Sensors Error Mapping and compensation HVM vs. low cost overseas high volume Identifying future trends for UKRI funding priorities Identifying suitable avenues to deploy Hub Flexible Funding Impact of Brexit on international cooperation (e.g. creation of standards) In process measurement In process measurement for complex processes (multiscale, through-life) Increased automation for global competitiveness Live Uncertainty Evaluation Machine Learning & AI (inc. Category Semantic Language) Machine learning and data analytics Making sensors safe in any environment Mass customisation and batch size reduction Metrology assisted large volume materials recycling Metrology for emerging energy sources Miniaturisation (inc. Photonic Integration) Modelling & Simulation (e.g. Digital Twin) New Materials (Graphene, Metamaterials etc.)

Non contact measurement of light absorbing materials e.g. carbon fibre Open access of research papers and data Optical Technology Overcome temperature limitations portable metrology Product through-life monitoring reduced lead times and cost, faster more efficient manufacturing processes Reduced waste and scrappage Repurposing parts and monitoring to extend life Self aware and self compensating measurement systems Sensornets Smart products processes and big data and analytics Standardisation - Leading the development of future standards for measurement Supply chain collaboration Technology for space missions including in space Traceability Uncertainty in data quality Understanding and improving tolerancing verified language for design, manufacturing and dimensional metrology, including international standards XCT XCT XCT XCT

Research Themes

Capabilities & Enablers

Adaptive control AI

Access to state of the art facilities (inc. metal AM, XCT, Ultra-precision machining)

Automatic defect recognition Calibration of XCT Calibration optimisation strategies Cloud based data processing for remote sensing systems Compensating for challenging operating conditions Connectivity solutions for metrology Correlation to verification process Data fusion and structures fast data processing technology Defect specification, definition and impact Design for AM Design for inspection/verification Design for manufacturing and inspection Digital inspection planning Efficient and secure analysis and evaluation of diverse data End of life inspection Energy efficient self powered sensors Environmental simulation to understand non-controlled environmental measurement Full process influence in complex assemblies Full volumetric temperature measurement GD&T and location strategies (eg for composition forming processes) Improved communication and accessibility of data Increased measurement speed of non-contact measurement devices for in-situ measurement Indirect measurement modelling In-process measurement of surface etc In-process metrology system integration and calibration Integration of data of decadal basis Intelligent data analysis and decision making AND closed loop control Low cost, flexible hardware design for metrology devices Material characterisation and variability (eg powders, composites) Measurement of non-rigid components Measurement system integration to machine Meta-materials measurement and photonic integration Metrology for environment optimisation Miniaturisation of devices Miniaturised reference standards in embedded systems/sensors Model based definition/3D digital tolerances Multi-material AM component inspection New sensor technology (eg miniaturisation, low cost etc) Non-contact measurement system traceability Portable metrology systems (in situ) Post-process material characterisation Process monitoring Real time systems RF integration Sensor integration into manufacturing processes Simulation and verification of design Skills and proficiency standard for metrology

Acoustic NDT AI and autonomous technology Coherent government support for UK mfg Community education measurement/metrology Continuous programme of researcher skills development - contract continuity Cross disciplinary consortia Data communication compatibility Digital platform for digital twin End users working with metrology institutes Engagement with ISO (and other national/international organisations) High speed secure and robust communications networks (e.g. 5G) HPC systems Industrial partnerships and industry engagement Infrastructure technology for AM GDT, design manufacture, metrology Knowledge representation and reasoning tool Machine readable semantics National and/or regional metrology centres (e.g. Hub, NPL, Metrology Institutes, HVM Catapults) (including funding) Open access materials database Open access, technology demonstrators Optical compressed sensing techniques as alternative to big data Outreach to public and policy makers

Software for compensating for adverse measurement conditions Swarm bot metrology Tolerance analysis True digital twin AND Virtual manufacturing and metrology system XCT of multi material AM (Inc. metal)

Photonic integrated circuit fabrication facilities Proficiency standards Rapid 3D surface mapping for comparison and micron nano level Real time error compensation during manufacturing Real-time metrology Recognition gained from high quality research outputs Research funding and finances Software agents for smart analytics and big data Software tool to predict errors prior to manufacturing Support from the Scientific Advisory Board Technology developers working with metrology institutes Universal data format for 3D Volumetric NDT scanning technologies and calibration World class AI research base World class applied mathematics research base World class data science research base World class optical sensor research base World class process optimisation and control research base XCT Measurement capability and standardisation

The Future Metrology Hub An EPSRC Manufacturing Research Hub

For more information please contact: Mr Christian Young Hub Manager

EPSRC Future Metrology Hub Centre for Precision Technologies University of Huddersfield Huddersfield HD1 3DH Tel. 01484 473709 Email. metrology@hud.ac.uk Website. www.metrology.org.uk Twitter. @HudMetrology