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Introduction

4DIGITALISATION AND NANO CHARACTERISATION: KEY ENABLERS

OCAS’ ambition is to carry out our research effectively, according to the highest quality standards and with maximum scientific profoundness. That is why, several years ago, “Digitalisation” and “nano characterisation” were defined as key enablers for the research centre. Both axes achieved a next level of maturity and this from multiple perspectives: — First, the human competencies — Second, the further update of our lab

Information management system (LIMS) towards JobManager© 4.5 — Third, high-tech analytical equipment to characterise material’s structure down to the nanometer level

MEET DICE AND NICE

Concerning our skilled staff, two transversal teams have been put in place to ensure high efficiency and structural integration in our research projects: the DIgital CEll (DICE) and the Nano Investigation CEll (NICE). The DICE team is active in all digital fields of artificial intelligence, machine learning, data mining, etc. Impressive progress has been made on plant database analysis, computer vision and digital image analysis in the fields of martensitic steels, electrical steels and high strength low alloy steels. Some examples are presented in this chapter. In particular, an important VLAIO funded project was approved on the latter steel family, targeting the synergy between high-throughput combinatorial research and modern digital techniques.

The NICE team is ever more intensely involved in the research projects, resulting in direct application of our high-tech analytical equipment in these projects. The laboratory’s LIMS system JobManager© has been further adapted to version 4.5 in order to further shape it towards a tool that ensures maximum compatibility between the experimental part of the lab and the post-analysis of all research data by using advanced artificial intelligence/machine learning and datamining approaches.

BRAND NEW MICROSCOPY LAB OPENS ITS DOORS

In 2021, OCAS opened its brand-new microscopy lab covering a whole series of microscopical and/or microstructural characterisation techniques, varying from FEG-SEM to FIB and FEG-TEM (both recently commissioned), to EPMA-SXES, including extensive sample preparation and imageprocessing tools. OCAS also has structurally reserved access to the latest generation Atom Probe Tomography (APT). More specialised and differentiating equipment is to come soon, such as nanomechanical testing and in-situ SEM analysis. Several cases of the direct application of this equipment are described in this chapter. By making use of OCAS’s new service in the field of microscopy, the customer has access to this world-class instrumentation without worrying about justifying a huge investment cost with respect to the amount of potential use cases, expensive spare parts, continuous maintenance, and training of personnel. Instead, OCAS keeps its equipment up and running, maintained up to the highest standards, and has the most experienced operators and experts available to support the customers’ needs. As a customer, you are more than welcome to attend the investigation and interact with our operators during the analysis.

Lode Duprez, Steven Keyzer & Jan Scheers

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