CONCLUSION

• In conclusion, outlier detection using wafer maps, stacked wafer map analysis, and die genealogy data is an essential tool for semiconductor manufacturers to improve quality and yield. yieldWerx provides advanced analytics and visualization tools to help manufacturers identify and address issues with product quality. By using yieldWerx, manufacturers can gain valuable insights into the manufacturing process and take precise actions to improve product quality and yield.

• Automated Assemble Map Generation

• Quality Assurance & Risk Elimination

• Cross Work Center Correlation

• External Data Source Integration

• Real time Lot Control and Disposition

• Executive Dashboard

• Part Average Testing