CoreMorrowE75LVDTMicrometer,Measuring Resolutionupto0.01μm!
Inductancemicrometerisakindofinstrumentwhichcanaccuratelymeasuresmalldimensional changes.E75isacontactLVDTmicrometer,whichcandetecttheexternaldisplacement deformationthroughtheinductiveprobe,withthemeasurementrangeof0~1mmandaccuracy betterthan100nm.
Characteristics
•Measuringrange0~1mm
•Touchscreendisplay
•Resolutionof0.01microns
•Contactmeasurement
•TouchscreencontrolorPCsoftwarecontrol
Structure
CoreMorrowE75inductancemicrometeriscomposedtheprobeandthemaincontrolbox.
1Probe
E75inductancemicrometerhasacontactprobe,whichcontactswiththeobjecttobemeasured andpushedbackbythemovementoftheobjecttobemeasured,orextendswiththemovement oftheobjecttobemeasuredduetointernalelasticforceTheprobeisfixedbythebracketandis incontactwiththeobjecttobemeasured.Theprobehasa0.15mmpretravel,whichissuitable forcertainprecompressionduringinstallationThechangeofprobeexpansionlengthwillchange thedistancebetweentheinnercoilandthearmature,resultinginthechangeofinductancein thecoil
2.MainControlBox
Themainbodyofthecontrolboxprovidesexcitationvoltagesignalfortheprobe,collectthe changeofDCvoltagesignalcausedbythechangeofinductanceoftheprobecoil,andamplifyit, andthenperformstransmissionanddisplaythroughtheprocessingofthemainbodyofthe controlbox
MainControlBoxofE75
TouchScreenDisplay
E75inductancemicrometerisequippedwithatouchscreendisplay,throughwhichintuitivedata displaycanbeperformed
①Powerswitch
②24VDCpowersupply
③RS-458interface
④LCD、RS-485selectorswitch
TypicalApplication
E75inductancemicrometerhasawiderangeofapplications,whichcanbewidelyusedin precisionmachinerymanufacturing,integratedcircuitmanufacturing,scientificresearch,national defenseandmetrologyForexample,itcanperformancemeasurementoflength(depth,height, thickness,diameter,taper,etc.),vibrationmeasurement,precisionpositioningsystem, micro-displacementdetection,micro-manipulatordisplacementdetection,opticalfiberdocking andotherfieldsrequiringmicro-displacementdetection.