TN Chip on board after potting of three die. Example placement of COB onto experiment card (left). Note that there are 4 placements for each COB containing 3 die for a total of 12 latchup die.
Jazz die being mounted on custom chip on board substrate prior to potting.
The Vanderbilt University Model 140 test chamber used for board and system level temperature testing. It is capable of producing temperatures between -75C and 175C.
Assembled SLU CubeSat containing Commodore payload
137Cs total ionizing dose test chamber at Vanderbilt University
NASA EPSCoR Stimuli 2014-15
Published on Dec 14, 2015
NASA Office of Education’s Aerospace Research & Career Development (ARCD) is pleased to release NASA EPSCoR Stimuli, a collection of univers...