SGIker courses catalog

Page 10

Ref.: 2611

General X-Ray Research Service

X-Ray Diffraction in a polycrystalline sample: Principles and Applications Dates

Duration

Course venue

April/May 2011

20 h.

Faculty of Science and Technology Bizkaia Campus, Leioa

Speakers: Dr. Aitor Larrañaga Varga, Dr. Fco. Javier Sangüesa Aguerri and Pablo Vitoria García. Service Technicians. Minimum/Maximum No. of participants: 5/30. Participant profile: Research personnel and professionals involved in material characterisation. Objectives to be fulfilled during the course: 1.- To set out the possibilities and capabilities of the X-Ray Service. 2.- To establish simple routes and access for researchers interested in the XRD technique in a polycrystalline sample. 3.- To assimilate the basic concepts of crystallography on a theoretical and practical level. 4.- To analyse the operational procedures for the identification of phases. 5.- To set criteria in order to extract the information contained in the diffractogram of a polycrystalline sample. Person to contact: Dr. Fco. Javier Sangüesa.

94 601 3574 serx@ehu.es

Course fee: - UPV/EHU ......................................................100 € - PRB users.....................................................300 € - External users ..............................................300 €

i For additional information to the course, obtain full program and register, visit: www.ehu.es/SGIker/en/formation 11


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