Page 1

Yebes Technological Development Center

Services The Center for Technological Developments (CDT) is a branch of the National Geographic Institute of Spain. The new anechoic chamber is opened for the R+D community and antenna engineering companies interested in antenna design and measurement.

CDTAC

Yebes Technological Development Center

CDTAC Laboratory

Cerro de la Palera s/n 19141 - Yebes Guadalajara Spain Phone: (+34) 949290311 Fax: (+34) 949290063

Alignment Touching Probe

Centro de Desarrollos Tecnol贸gicos de Yebes Instituto Geogr谩fico Nacional (Spain) Phone: (+34) 949290311 Fax: (+34) 949290063 Email: f.tercero@oan.es


Antenna Measurements at the CDT

Anechoic Chamber Overview

Software: NSI 2000 Professional Edition Advanced scripting features, powerful beam table generator for multi–beam, multi-frequency measurements, error correction (drift check, MTI).

The CDT anechoic chamber dimensions are 11.5x5x5 meters and utilizes a 1.83x1.83 meters planar scanner with a positional accuracy and planarity after correction selected in order to have a maximum of λ/16 error at the higher working frequency

Acquisition, Processing and Presentation Software

(140GHz). A sliding rail allows the AUT displacement from the OEWG probe used to sample the field in either reception or transmission, depending on the configuration, in both the near and far field by up to 5.5 meters. The chamber is constructed from a modular panel system which guarantees a shielding

Positioning system Features

3D Radiation Pattern

X

Y

Z

AUT Z

Roll

Travel

1.83m

1.83m

0.25m

5.48m

360º

Resolution

25µm

25µm

6µm

50µm

0.0125º

25.4cm/s

38cm/s

1.3cm/s

25.4cm/s

40º/s

50µm

50µm

50µm

50µm

0.05º

performance of at least 90dB at 40GHz. The RF systems Speed

nominal design permits a dynamic range of at least 60-90dB in the

entire

2-140GHz

range

allowing

highly

sensitive

measurements to be performed. A completely automated system both pre and post measurement has been installed to facilitate the acquisition and processing of data and ensuring a quick turn-around time.

Accuracy Planarity

25µm rms

Radio Frequency System Design The RF system is based on the following Agilent instrumentation:

RF Components Measurement and Material Characterization

E8364B PNA up to 50GHz, 85309A LO/IF distribution unit, 85320A test mixer module, 85320B reference mixer module. The maximum measurement frequency is 140GHz . To achieve this value, three OML microwave heads are used: N5260AW15, N5260AW10 and N5260AW08.

OEWG Probe E8364B Agilent PNA X Band Feeding System

Optical bench WRWR-8 mmmm-wave Heads

Profile for Real Observatorio de Madrid

IGN Yebes Technology Development Center  

Brief description of IGN Technology Development Center at Yebes Observatory (Spain)

IGN Yebes Technology Development Center  

Brief description of IGN Technology Development Center at Yebes Observatory (Spain)

Advertisement