Use Surface Analysis Techniques in your Laboratory by ORS
ORSoffers a wide range of analytical techniques for material evaluation, processmonitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases,organics and inorganic. Our scientific staff will recommend the analytical technique that will best meet your requirements.
Surface Analysis Techniques: Micro Fourier Transform Infrared Spectroscopy : (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces. Scanning Auger Microanalysis: Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth. Material Characterizations and Identification Techniques ° Scanning Electron Microscopy (SEM ) ° Backscattered Electron Imaging (BSEI) ° Energy Dispersive X-ray Microanalysis ° Fourier Transform Infrared Spectroscopy (FTIR) ° X-ray Diffraction ° Ion Chromatography ° Organic MassSpectrometry (GC/MS) Importance of Surface analysis:
Analyzing how the surface of a product will behave is very essential as areasof various elements are totally interwoven into many aspects of our everyday life. Basedon the behavior of the top region, different components can be used for different purposesand products. So you should have details about content areas. These details can be collected using the technique of surface analysis.
To be able to comprehend the qualities and reactivity of any area it is necessary to comprehend its physical terrain, material design, nuclear and substance framework, the electronic condition, and the way in which the surface substancesconnection with each other. Different methods of area research have been designed to evaluate and comprehend these different features of surface. While it is not necessary to comprehend all of these features for individual programs, having a essence about them always helps improve the quality of products and programs. To be able to get specific information about the area, it is necessary to somehow intervene with its condition in some way. This could be in the form of junk mail the top area with electrons, photons or ions. While the bombardment is not significant, it does have an impact on the physical and substance qualities of the top region. However, by managing the surroundings in which this bombardment is performed, it is possible to control the changesthat take place in the top spot. This atmosphere is best designed through the use of contemporary research gadgets known as surface analyzers. Another name given to these analyzers is profilometers as they help make finish information of the surface of any materials. Majority of spot analyzers contain a stylus pen that has a signal at its tip. This signal choice up area problems and features and transforms these into user understandable format. In the simplest of terms, a spot analyzer is a device that decides quality of a region by assessing and increasing the current changesthat take place when a sensitive stylus pen is moved over it. The current generated from such movement is fed into an indication that magnifies it up to 50,000times to create a accurate and detailed map of the area under analysis.
About Us: Oneida Research Services速(ORS)offers specialized laboratory testing services to support the microelectronics, tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORSstrives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.
Address: 8282 Halsey Road Whitesboro, NY 13492 Phone: (315) 736-5480 ext. 2202 (Deborah Delluomo) Fax: (315) 736-9321 http://www.orslabs.com
Oneida Research Services offers surface analysis techniques to include, Scanning Electron Microscopy (SEM), Backscattered Electron Imaging e...