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2011 FUTURE PRODUCT CATALOG

2011 Future Product Catalog


2011 FUTURE PRODUCT CATALOG


2011 FUTURE PRODUCT CATALOG

Attention to detail in the nanoscale 國際級的視野,奈米級的細節


2011 FUTURE PRODUCT CATALOG

04


Content 2. 3. 4.

5.

Product Overview p.7 Core Technology Overview p.9 A-100 / AFM Simulation System p.11 Opus 300 / Closed-Loop Scanning Probe Microscope p.13 Opus Hybrid 100 / ADS-Based Single Point Vibrometer System p.17

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2011 FUTURE PRODUCT CATALOG

1.


2011 FUTURE PRODUCT CATALOG

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09


PRODUCT OVERVIEW 1.

1

AFM Simulation System (Expected Q1 2011) / 原子力顯微鏡模擬器 The AFM Simulation System is designed for teaching entry-level users the concepts behind atomic force microscopy. The target market for this product would be middle school and high school students, as well as entry-level industrial employees in need of basic training.

2.

Nano Linear Positioner (Expected Q4 2011) / 奈米位移系統 X and Y-axis linear positioners are designed with accurate nano-level stepping resolution using an inertial drive method. These positioners are essential for XY sample positioning in a wide range of applications. The target market for these positioners would be for research labs, fabrication labs, and quality control labs.

3.

Opus Hybrid Systems for Optical Microscopes / 光學顯微鏡整合系統

07

a _ Hybrid 100 - Single-point Vibrometer for Optical Microscopes (Expected Q1 2011) b _ Hybrid 300 - Optical profiler for Optical Microscopes (Expected Q4 2011) c _ Hybrid 500 - AFM for Optical Microscopes (Expected Q1 2012) 4.

Opus Systems for Scanning Probe Microscopy / 原子力顯微鏡系統 The Opus System line of products is focused on the variations of scanning probe microscopy. The products will range from the low cost Series 100 to the higher end Series 500. a _ Opus Series 100 - Open - loop low-cost SPM (Expected Q4 2011) b _ Opus Series 300 - Closed - loop SPM (Expected Q2 2011) c _ Opus Series 500 - High-end, Multimode, Bio SPM (Expected Q4 2012)

2011 FUTURE PRODUCT CATALOG

The Opus Hybrid line of products use the astigmatic detection system as its core module attached to an optical microscope, to scale from applications as a single-point vibrometer, to a optical profiler, to an AFM. Each product is upgradable from From 100 to 300 to 500, with additional hardware modules.


(a)

Z

,

Photosensor Y

D A C B

Z

,

,

X

Astigmatic lens

,

Polarizing beam splitter Laser diode Collimator Z

Objective lens +

Measured Object

08

O _

2011 FUTURE PRODUCT CATALOG

(b)

ΔZ

X

SFE=(SA+SC)-(SB+SD)

D A C B

-ΔZ

SFE>O

D A C B

+ΔZ

SFE =O O

SFE<O

D A C B Linear region

Defocus distance

Y


2

CORE TECHNOLOGY OVERVIEW One of ARDIC Instrument’s core technologies is the use of an astigmatism detection system (ADS). While the optical mechanism used in the ADS is different from the mechanisms used in traditional AFM optical units, the ADS is capable of achieving nanometer resolution images. By developing a patented method of using astigmatic detection for measuring the deflection and tilt of a surface in nanometer resolution, we are able to replace the traditionally bulky and expensive optical units in vibrometer, optical profiler, and SPM systems. This offers the following advantages: • Highest resolution at 0.035 nm • Not easily influenced by environmental changes • High bandwidth (100MHz vs ~1MHz) • High scan speed (10s/frame vs ~100 s/frame) • Thin profile allows flexible applications • Thin and compact profile reduced thermal drift • Less components result in higher durability • ADS technology is mature and reliable • ADS technology is precisely pre-assembled • Reliable systems reduce service costs • Does not require additional adjustments • Easy to operate • Small laser spot size (0.56 micron vs ~30 micron) 2

3

4

2011 FUTURE PRODUCT CATALOG

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09

1.

CD-R ( 5μm×5μm )

2.

CMOS Microlens ( 20μm×20μm )

3.

Intergrated Circuit ( 5μm×5μm )

4.

Polystyrene Beads ( 5μm×5μm )


2011 FUTURE PRODUCT CATALOG

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A-100 / AFM SIMULATION SYSTEM

3

The A-100 is a pioneering system that simulates the concepts of atomic force microscopy (AFM). Designed to demonstrate the use of optics and cantilever probes, the A-100 system magnifies the underlying physics for students to easily understand how microscopy works at resolutions beyond the limit of light.

Ideal as the first step into the world of nanotechnology, the A-100 allows the user to learn, observe, and experiment. The A-100, along with e-learning materials, lab manuals, and easy-to-use software, allows students to explore the following subjects: • Principles of atomic force microscopy • Principles of closed-loop control systems • Principles of AFM imaging • Principles of force curve measurements • Effect of different probe sizes • Effect of different probe materials

11

X-Y scan range: 30mm x 30mm Scan resolution: 250 pixels 2 ( 211 dpi 2) Interface type: USB Power requirement: 110 v Size: 195mm (L)x 195mm (W)x 290mm (H)

2011 FUTURE PRODUCT CATALOG

Technical Specifications:


2011 FUTURE PRODUCT CATALOG

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OPUS 300 / CLOSED-LOOP SCANNING PROBE MICROSCOPE

4

Applications: Physical science, polymer composites, phase transitions, surface morphology, defects, coating, nanoparticles, carbon nanotubes, crystal structure. Technical Specifications: Supported Mode: Contact mode, Tapping mode, EFM, MFM, Nanolithography, Force Mode Size: Close 145mm (L)x 155mm (W)x 188mm (H) Open 145mm (L)x 155mm (W)x 268mm (H)

Scanner Control type: Closed loop / Open loop Closed loop scanner working range of XYZ (um): 100 Open loop scanner working range of XYZ (um): 120 Resolution of XYZ (nm): 1 Noise of XY (nm): 0.1 Noise of Z (nm): 0.01 Signal input rate (CH/bit/kHZ): 10/16/200kHz (low speed) Signal output rate (CH/bit/kHz): 4/16/200kHz Drive (CH/bit/kHz): 2/16/500kHz Interface: Ethernet Isolation: Localized sample environment isolation Software Imaging: Phase imaging, 3D rendering Pixel Resolution: 1024x1024

13

2011 FUTURE PRODUCT CATALOG

Stage working range of XY (mm): 13 Stage working range of Z (mm): 2 Stage resolution of XY (mm): 0.01 Maximum sample size: 20mm x 20mm x 10mm Maximum sample load: 4.5kg


2011 FUTURE PRODUCT CATALOG

14 a b

c d

e f


a d e f

15

b

Chamber Opening Release Button and Safety Lock b _ Gas Spring Assisted Opening c _ Comfortable sample approach with Z height warning indicator d _ 13mm Travel XY Sample Stage with Centering Indicators e _ Open Loading Mode and Closed Scanning Mode f _ Novel Cantilever Chip Design a

_

Y-axis laser adjustment b _ X-axis stage adjustment c _ Y-axis stage adjustment d _ Cantilever chip e _ Sample isolation seal f _ Optical pickup unit a

_

2011 FUTURE PRODUCT CATALOG

c


2011 FUTURE PRODUCT CATALOG

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OPUS HYBRID 100 / ADS-BASED SINGLE POINT VIBROMETER SYSTEM

5

Applications: Aerospace, Acoustic, Life Science, MEMS, Calibration, Electronics Diagnostic Technical Specifications:

17

2011 FUTURE PRODUCT CATALOG

Eyepiece zoom: 4x Objective zoom: 10x Z displacement resolution: 0.035nm Focus: 2mm Laser: 650, 790 nm (Red) Mechanism: Optical Microscope Mount Electric Power Input: 110, 220V Measurement: Thermo-tune, Vibration A/D: 2 Channels, 65MHz Frequency Range: 1Hz-65MHz


2011 FUTURE PRODUCT CATALOG


ARDIC Instruments offers a pipeline of analytical instruments for educational, research, and industrial applications in nanotechnology. Our mission is to build Taiwan's first internationally recognized analytical instruments company through emphasis in quality, precision, and service.

ARDIC Instruments Co. 嘉原科技股份有限公司 4F, No. 415, RuiGuang Rd., Neihu District, Taipei, Taiwan 11492 11492 台北市內湖區瑞光路 415 號 4 樓 T: + 8862-8797-4778 | F: + 8862-8797-4778

2011 FUTURE PRODUCT CATALOG

www.ardic.com.tw


2011 FUTURE PRODUCT CATALOG


ARDIC Future Catalog 2011