SELECTED TEST CHARTS TE263
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Scan reference chart To ensure that each and every scan is in focus, correctly exposed, and white balanced the scan reference chart is the right chart to put aside of your archiving assets. The chart consists of gray steps, color patches, a scale and resolution pattern. It allows automatic analysis of each scanned page and - in combination with the right software - provides information for the reason if a specific page happens to be out of specs.
SPECIAL CHARTS (MICROSCOPY, MACRO, ENDOSCOPY) To produce charts for macro photography, microscopy or endoscopes is a challenge for all chart manufacturers. Charts with bitonal pattern are easy to produce as chrome on glass or transparent film but when it comes to half toning things get difficult. Here is a selection of a few charts that are suited or designed for systems that photograph small objects. Our TE188 is the X-Rite ColorChecker that we are able to manufacture in a 24x36 mm size. It can be used to verify the color reproduction quality in combination with our IE-Analyzer software. The USAF 1951 (TE136), ISO pattern No. 1 (TE143) and the ISO pattern No. 2 (TE132) are targets that consist of bitonal structures with up to 512 cycles/mm. They are made for visual inspection. TE132
TE188
TE136 TE143
For the determination of the MTF for these devices we can also produce bitonal Siemens stars (TE120, TE121, TE148) that are supported by the IE-Analyzer from Version 5.0 on that we will introduce in September 2010. The OECF can be determined using the 24x36 mm ISO21550 (TE240) that was originally designed for scanners and is supported by the IEAnalyzer as well. In addition we sell all the Applied Image targets that include scales, grids, and other calibration pattern for microscopes and related devices. Please contact our website www.image-engineering.de for further informaion. TE120 TE121
TE240
TE148
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